Phase change recording material for information recording medium and information recording medium using said material
A technology for recording materials and recording media, applied in recording carrier materials, optical recording carriers, recording/reproducing by optical methods, etc., can solve problems such as difficult crystallization of recording layers
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Embodiment 1 and 2 and comparative example 1-4
[0212] Formed (ZnS) by sputtering on a disk-shaped polycarbonate substrate with a diameter of 220 mm, a thickness of 1.2 mm, and guide grooves with a groove width of about 0.5 μm, a groove depth of about 40 nm, and a groove pitch of 1.6 μm. 80 (SiO 2 ) 20layer (80 nm), Ge-Sb-Sn recording layer (15 nm), (ZnS) 80 (SiO 2 ) 20 layer (30 nm) and Al 99.5 Ta 0.5 Alloy reflective layer (200 nanometers), so as to make a phase-change optical disc.
[0213] When the recording layer composition is composed of (Sb 1-x sn x ) 1-y Ge y When expressed, the values of x and y are shown in Table 1.
[0214] Composition (Sb 1-x sn x ) 1-y Ge y
x
y
initial crystallization
record performance
Remark
Example 1
0.25
0.18
it is good
it is good
Example 2
0.32
0.18
it is good
it is good
Comparative Example 1
0
0
0
0.11
0.16
0.21
Differ...
Embodiment 3
[0247] The following examples were carried out to examine whether the phase-change recording material of the present invention can be used as a recording material for an information recording medium on which recording is performed by a change in resistance.
[0248] That is, on a polycarbonate substrate with a diameter of 120 nm, Ge 0.18 Sb 0.66 sn 0.16 [(Sb 1-x sn x ) 1-y Ge y , where x = 0.2, y = 0.18] amorphous film. After measuring the resistivity of this amorphous film, the film was crystallized, and then the resistivity of the recrystallized film was measured. Crystallization was performed under the same conditions as those of the discs of the examples, and for the measurement of the resistivity, a resistivity meter Loresta MP (MCP-T350) manufactured by DIAINSTRUMENTS was used. The resistivities before and after crystallization are 1.03×10 -1 Ωcm and 0.80×10 -4 Ωcm, from which a resistivity change of almost three orders of magnitude can also be found between the...
Embodiment 4-11 and comparative example 6
[0256] In order to measure the composition of the phase-change recording material used in the recording layer of the optical recording medium, acid-dissolved ICP-AES (Inductively coupled Plasma-Atomic Emission Spectrpometru, inductively coupled plasma-atomic emission spectrometry) and x-ray Fluorescence analyzer. As for the acid dissolution ICP-AES, it used JY 38 S manufactured by JOBIN YVON as an analyzer. Dissolve the recording layer in diluted HNO 3 In , a matrix matching calibration method is used for quantitative evaluation. As for the X-ray fluorescence analyzer, RIX3001 manufactured by RigakuDenki Kogyo K.K. was used.
[0257] Using DDU1000 manufactured by PULSTEC INDUSTRIAL Co., Ltd., the performance of the disc was measured by applying focus servo and tracking servo to the groove with a retrieval power of 0.8 mW.
[0258] On a disc-shaped polycarbonate substrate with a diameter of 120 mm, a thickness of 1.2 mm, a groove width of about 0.5 microns, a groove depth of...
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