Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Program executive system for semi-conductor test instrument

A technology for program execution and program testing, which is applied in the field of program execution systems and can solve problems such as poor portability, limited functionality, and slow execution speed of general programming languages

Inactive Publication Date: 2007-01-03
ADVANTEST CORP
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the purpose statement is interpreted line by line during this execution, there is a problem that the execution speed is slower than in the case of using a general-purpose programming language such as C language.
[0004] In addition, there is such a problem for programmers of device test programs: the purpose of their familiarity with programming is to program their device test programs, so they cannot fully grasp the general programming language
[0005] There is also the problem that since the algorithm statement of the device test program is written in a unique non-programming language, it is not easy to rewrite the program in a general-purpose programming language such as C language, making it portable to Poor portability of general-purpose programming languages
[0006] In addition, since limited-purpose programming languages ​​are often used in device test programs, the available functionality is limited compared to the case of general-purpose programming languages ​​such as C

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Program executive system for semi-conductor test instrument
  • Program executive system for semi-conductor test instrument
  • Program executive system for semi-conductor test instrument

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] A semiconductor tester according to an embodiment of the present invention will now be described with reference to the drawings.

[0017] figure 1 The entire structure of the semiconductor tester of this embodiment is shown. The semiconductor tester 100 shown in is composed of a tester processor 10 , a tester 20 and a test head 30 . The semiconductor tester 100 is configured such that a semiconductor device DUT 32 to be tested can be tested with the test head 30 .

[0018] The tester processor 10 is composed of a core 11, programs 12 and 13, an execution emulator 14, an I / O (input / output) control emulator 15, and a tester bus emulator 16, designed to control the operation of the tester 20 . One of the programs, program 12, is written in C, a general programming language. Another program, program 13, is written in a non-generic programming language for which these semiconductor measures are written. The two programs 12 and 13 constitute a device test program specify...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention is one program executing system for semconductor measuring instrument. In this system, the device measuring program includes the first sentence written in universal program design language and the second sentences written in special program design language related to the semiconductor measuring instrument, with all the sentences being executed in separated program executing parts.

Description

technical field [0001] The present invention relates to a program execution system of a semiconductor tester for performing various operation tests on semiconductor devices such as semiconductor memories. Background technique [0002] Conventionally, semiconductor testers for performing predetermined operation tests on various semiconductor devices are known. For example, such semiconductor devices as DUT (device under test) include semiconductor memories, logic ICs (integrated circuits), linear ICs, etc., and each semiconductor device is tested with an appropriate semiconductor tester. These assorted semiconductor testers are designed to perform predetermined functional tests, DC tests (DC parametric tests), etc. by executing predetermined device test programs programmed by the user. The device test program is roughly composed of three parts: test control statement, data processing statement and algorithm statement. The test control statement includes various instructions...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01R31/26H01L21/66
Inventor 山下安吉
Owner ADVANTEST CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com