System, equipment and method for automatic testing IC complete device

Abstract

The testing system includes the testing computer, the automatic plugging and pulling out mechanism, the temp control set and the control set. The testing computer is used for holding and testing the IC to be bested. The automatic plugging and pulling out mechansm puts the IC to be tested on the testing computer and takes the IC tested off from the testing computer. The temp control set controls the temp of the IC to be tested. The control set is connected to the testing computer and the plugging and pulling out mechanism electrically, controlling the operation of the plugging and pulling out mechanism. The testing computer combines the IC to be tested forming an integrated computer. The temp control set controls the temp at preset condition. The control set carriage out the integrated testing.

Description

technical field [0001] The present invention relates to an automated integrated circuit complete machine testing system, device and method thereof, in particular to an automated integrated circuit complete machine test system, device and method capable of simulating the state of an end user and performing dynamic testing. method. Background technique [0002] Computers have almost become one of the necessities of life for today's human beings, whether servers (servers), workstations (Workstations), desktop computers (desktop computers), notebook computers (notebook computers) or portable computers (portable computers) ), or personal digital assistant (personal digital assistant) or palm-top PC (palm-top PC) or pocket PC (pocket PC), or even industrial computer (industrial computer), has become a part of most people's daily life share. These computers are composed of many integrated circuits (ICs), and these integrated circuits must undergo complicated tests to ensure the q...

AI Technical Summary

Problems solved by technology

[0009] 1. The known integrated circuit test cannot simulate the final use state of the user, so even if it passes the test, problems may occur when the user uses it, such as conflicts with software, etc.

[0010] 2. It is known that all the components placed on the test circuit board are the same type during the test of the known integrated circuit, and the compatibility problem between different components cannot be detected.

[0011] 3. The known test methods still rely on a lot of labor, which limits the production capacity and cost, and also causes the possibility of human error

[0012] 4. The known test method for integrated circuit modules cannot control the operating temperature of the components after the integrated circuit is assembled, that is, at the module stage, so it cannot be simulated for certain states in actual use.

[0013] 5. After the known integrated circuit under test is tested at high temperature, the integrated circuit under test must be moved to other automatic test equipment, and then tested at low temperature. This test method is not very efficient.

[0014] 6. The judgment of known tests is generally based on the final integrated circuit state, and some dynamic errors cannot be detected. For example, in the case of graphics accelerators, image drift (video shaking) and hue variation generated during actual program execution Phenomena such as discoloring display, ghost shallow or white block cannot be detected

Or crashes caused by integrated circuit software execution, etc., cannot be detected by traditional testing methods

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