Probe card for LCD detection

Abstract

The present invention provides a probe card for testing a liquid crystal display which is consisted of an assembly holder, a substrate holder, a needle holder, a circuit substrate with driver IC thereon that is sticked on the upper surface, a guide plate sticked at the bottom surface of the needle holder which is consist of a plurality of needle insert trench formed on the upper surface and an align trench formed at the outer surface of two side and parallel to the needle insert trench and is formed through the needle insert trench, and a needle plate inserted to the needle trench of guide plate which is flexible at two end, one end of the needle plate is through the guide hole formed on the guide plate to form an LCD connect end, the another end of the needle plate is stand out the upper surface of guide plate to form substrate connect end, and the needle plate connect to the outside surface of the needle holder that is stand out the upper surface of back end of needle holder to form a salient.

Description

technical field [0001] The present invention relates to a probe card for LCD inspection, and more particularly to a probe card that reduces the thickness of a guide plate made of silicon material that supports the stylus board by reducing the insertion thickness of the stylus board, thereby saving manufacturing costs. At the same time, it promotes the thinning of the probe card; in particular, it is a probe card for LCD inspection that can improve the efficiency of LCD performance inspection by stably protecting each connection terminal of the probe board that contacts the circuit pattern. Background technique [0002] Generally speaking, as image display devices such as small TVs and notebook computers, LCDs (liquid crystal display devices) are mainly used. The edges of the LCDs are provided with high-density devices for applying electrical signals (such as image signals, synchronization signals, and color phases). Signals, etc.) with tens or even hundreds of connection ter...

AI Technical Summary

Problems solved by technology

[0014] However, in this structure, the thickness of the guide plate 5 will be excessively thickened. In order to make the two guide plates 5 bonded to form a stacked layer structure, the operation becomes too complicated and other inconveniences.

[0015] In particular, when the stylus insertion groove 5a is formed on the guide plate 5, the processing depth (approximately 500 μm) is formed too deep, so there is a problem that the so-called confirmation of the workability by a microscope is inaccurate.

[0016] That is, the depth seen through a microscope is about 170 to 300 μm, and since the above-mentioned structure is formed at a depth of about 500 μm, it is impossible to accurate

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