Gray mask defect checking method
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HOYA CORP
- Publication Date
- 2004-10-13
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The present invention relates to a device having a gray-tone portion having an adjusted light transmittance area for selectively changing the film thickness of a photoresist film by reducing the light transmittance of the area. A defect inspection (judgment) method, a defect correction method, etc. of a gray tone portion of a gray tone mask. Background technique
[0002] In recent years, in the field of masks for large LCDs, an attempt has been made to reduce the number of masks using a gray tone mask (Non-Patent Document 1).
[0003] Here, a gray tone mask such as Figure 5 As shown in (1), a light-shielding portion 1 , a light-transmitting portion 2 , and a gray tone portion 3 are provided on a transparent substrate. The gray tone portion 3 is, for example, an area where a light-shielding pattern 3a below the limit resolution limit resolution of a large-scale LCD exposure machine using a gray tone mask is formed, and the amount of light transmitted ...