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Film image processing apparatus and film image processing method

A technology of image processing and film, applied in measuring devices, image communication, television, etc., can solve problems such as inability to properly repair scars

Inactive Publication Date: 2005-03-16
NORITZ CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, after adopting the technology described in the above-mentioned patent document 1, there is the following problem: for a slide-type film clamped by a slide mount (slide mount), and a frame image of a normal size in a roll of film and A photographic film in which two images of one frame image of a panorama image narrower than the usual size are mixed, and defects caused by scratches, etc. cannot be properly repaired
As a result of infrared rays being blocked by the light-shielding plate, the intensity of infrared rays at this part is lower than the threshold value for defect detection, which is the basis for judging defects caused by scars, so it is recognized as a defect. Correction of distribution intensities handles issues

Method used

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  • Film image processing apparatus and film image processing method
  • Film image processing apparatus and film image processing method
  • Film image processing apparatus and film image processing method

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Embodiment Construction

[0033] Next, an embodiment of the film image processing apparatus of the present invention will be described. The image processing device is a device that photoelectrically reads the image captured on the film F one by one through the linear CCD sensor 6a as a solid-state imaging element. The image input unit 10 controls the image input. The image input control section 20 for the image input operation of the image input section 10 and the image processing section 30 for performing necessary image processing on the film image data input from the image input section 10 are constituted.

[0034] The image input unit 10 has: a slit light that irradiates the light beam from the halogen lamp 1, diffuses the light beam from the halogen lamp 1, and gathers the diffused light beam into the slit light in the short direction of the film F. The light source unit 100 of the light beam used for reading the film image within the infrared wavelength region formed by the slit 3; the imaging le...

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Abstract

A film image processing apparatus is provided comprising a light source for emitting the flux of light including a range of infrared ray wavelengths towards a particular type of film such as a mount type or a panoramic type, an infrared ray detector for detecting the transmitted components through the film of the flux of light emitted from the light source, and an error data detecting means for detecting an error data on the film from a profile of infrared ray intensity determined by the infrared ray detector. It also includes an infrared ray intensity correcting means provided with a lookup table for correcting the input / output characteristic in the infrared ray detector to a linear form and arranged to, when the input is not higher than a specific threshold level lower than the error detection threshold predetermined for the error data detecting means identifying the error on the film, convert the input to the output higher than the error detection threshold.

Description

technical field [0001] The present invention relates to a light source unit that irradiates a light beam in the infrared wavelength range to a film, an infrared detection unit that detects a transmission light beam transmitted through the film by the light beam from the light source unit, and an infrared detection unit based on the infrared detection unit. The detected infrared intensity distribution is used to detect the defect information of the film, the film image processing device and the film image processing method of the defect information detection unit. Background technique [0002] In the prior art, as an image processing method and device for detecting flaws such as scratches and attached dust on the film, and correcting the detected flaws and dust through image processing, the following schemes have been proposed: irradiating infrared energy onto the film And visible light energy, corresponding to the position on the film to detect the distribution of infrared e...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/892H04N1/00H04N1/04H04N1/19H04N1/409H04N5/253
CPCH04N1/00047H04N1/00082H04N1/4097H04N1/00058H04N1/00005H04N1/00034H04N1/00002H04N2201/0408H04N1/00053
Inventor 宫内满
Owner NORITZ CORP