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Laser feed-back wave plate measuring apparatus

A laser feedback and measurement device technology, applied in the field of laser measurement, can solve the problems of measurement accuracy limitation, multi-instrument error and azimuth adjustment error, increase the complexity of the measurement system, etc., and achieve the effect of convenient use and simple structure

Inactive Publication Date: 2005-12-21
TSINGHUA UNIV
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Problems solved by technology

This increases the complexity of the measurement system, and due to the introduction of more instrument errors and azimuth adjustment errors in the measurement process, the further improvement of measurement accuracy is limited

Method used

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  • Laser feed-back wave plate measuring apparatus
  • Laser feed-back wave plate measuring apparatus
  • Laser feed-back wave plate measuring apparatus

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example

[0047] Example: such as figure 1 or figure 2 In the experimental system of , when the feedback mirror 4 is driven by the piezoelectric ceramic 3 and moves left and right along the laser axis, the laser intensity modulation curve measured by the first photodetector 14 is as follows image 3 (a) shown. image 3 There are 5 curves in (a), wherein: Curve 1 is the driving voltage of piezoelectric ceramics; Curve 2 is the laser intensity modulation curve when there is no wave plate in the feedback external cavity, which is called the traditional laser feedback curve; Curve 3, curve 4 and curve 5 respectively correspond to the laser intensity modulation curves when the phase difference of the measured wave plate is 20°, 35° and 80°. From image 3 (a) It can be seen that when the laser feedback external cavity contains a wave plate 6, a depression or protrusion appears at point B of the laser output intensity modulation curve, which shows that when there is a wave plate in the ext...

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Abstract

A measuring device of laser feedback wave plate applies 632.8 nm He - Ne laser and external reflector to form laser feedback system for measuring phase delay of wave plate by utilizing principle of having linear relationship of two polarized states duty ratio to the phase delay of the wave plate to be tested in one modulating period of laser intensity.

Description

technical field [0001] The invention belongs to the technical field of laser measurement. Background technique [0002] As a phase retarder, wave plates are widely used in optical systems related to polarized light, such as heterodyne laser interferometers, polarized light interference systems, polarized light microscopes, ellipsometers, optical isolators, narrow-band optical filters, Dimming attenuators, optical pickups for optical disc drives, etc., among which quarter-wave plates with π / 2 phase difference are most commonly used. As an important component of the optical system, the accuracy of the phase retardation of the wave plate itself will affect the effect or measurement accuracy of the entire system. Therefore, accurate measurement of wave plate retardation is very important. In many optical systems, it is necessary to accurately know the phase difference of the wave plate, which requires a high-precision measurement method. At present, there are many high-precis...

Claims

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Application Information

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IPC IPC(8): G01M11/02
Inventor 张书练费立刚
Owner TSINGHUA UNIV
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