Method and apparatus for aiming at wafer direction using laser
A laser alignment and wafer technology, applied in the direction of electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve the problems of complex alignment accuracy and low alignment of the crystal orientation method, and achieve high alignment accuracy and simple operation Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0040] like figure 1 As shown, the first wafer 3 selects Si epitaxial wafer for use, the crystal orientation is (100), the size is 2 inches, and the thickness is 380 microns, and the (110) cleavage plane is cleaved; the second wafer 4 selects GaAs epitaxial wafer for use, and the crystal To (100), the size is 2 inches, and the thickness is 350 microns, and the (110) cleavage plane is cleaved; the first wafer 3 is fixed on the first five-dimensional adjustment frame 1 by the first sucker 2, and the second wafer 4. The second suction cup 5 is fixed on the second five-dimensional adjustment frame 6, and the two five-dimensional adjustment frames can rotate horizontally, vertically, and three-dimensionally. A five-dimensional adjustment frame makes the bonding surfaces of the first wafer 3 and the second wafer 4 substantially parallel; the first chuck 2 and the second chuck 5 are all selected vacuum chucks; the laser 8 adopts a helium-neon laser, and the spot diameter of the laser...
Embodiment 2
[0046] In order to improve the precision of crystal orientation alignment, on the basis of Embodiment 1, the device further includes a pinhole diaphragm 7 placed in front of the light exit of the laser 8 , and the laser light passes through the pinhole diaphragm 7 . The pinhole aperture 7 uses a self-made pinhole aperture, namely: poke a small pinhole with a diameter of 1mm on a circular thick paper sheet with a diameter of 30mm and a thickness of 0.1mm, and then fix the thick paper sheet on a movable bracket (not shown in the figure). In this embodiment work process, the helium-neon laser is incident on the cleavage surface of the wafer by the aperture diaphragm 7, and the orientation of the wafer is adjusted so that the reflected laser light from the cleavage surface returns by the aperture aperture 7, which can improve Alignment accuracy. The alignment accuracy depends on the length of the optical path of the laser and the pinhole size of the pinhole screen. In this embodi...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 