Multi-reflecting time-of-flight mass spectrometer and a method of use

Abstract

A multi reflecting time-of-flight mass spectrometer MR TOF MS 11. the flight path of ions from an ion source 12 to a receiver is folded along a trajectory by two parallel gridless electrostatic mirrors 15, elongated in the shift direction 7, orthogonal to the direction of reflection. A set of multiple lenses 17 is positioned in the drift space 14 between the mirrors to provide for spatial focusing of ions in the plane of the folded ion path. Each mirror consists of at least 4 electrodes 15C, 15E, 15L arranged and controlled so that to improve ion optics properties. Namely, in addition to time-of-flight focusing in energy and spatial focusing across the plane of the folded ion path, the mirrors also provide time-of-flight focusing with respect to the spatial spread of ions across the said plane. Because of improved spatial and time focusing, the MR TOF MS of the invention provides for a wider acceptance and confinement of ion beam along an extended folded ion path.

Description

technical field [0001] The present invention generally relates to the field of mass spectrometry, and more particularly to a multi-reflection time-of-flight mass spectrometer (MR-TOF MS) and a method of use. Background technique [0002] Mass spectrometry is a well-established tool in analytical chemistry for the identification and quantification of various compounds and mixtures. The sensitivity and resolution of this analysis are critical for practical use. It is well established that the resolution of TOF MS is directly proportional to the length of the flight path. However, it has been recognized that increasing the flight path while keeping the instrument at a reasonable size is difficult. The proposed solution is a multiple reflection time-of-flight mass spectrometer (MR-TOF MS). The use of MR-TOF MS became possible after the introduction of an electrostatic ion mirror with time-of-flight focusing properties. US Patent No. 4,072,862, USSR Patent No. SU198034 and So...

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Problems solved by technology

However, this is resolution at the expense of loss of sensitivity and, in the case of coaxial reflections, a shortened mass range

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