Multi-reflecting time-of-flight mass spectrometer and a method of use

A time-of-flight and mass spectrometer technology, applied in the field of mass spectrometry, can solve the problems of loss of sensitivity, shortening the mass range, etc., and achieve the effect of uniform acceleration field

Active Publication Date: 2006-10-25
LECO CORPORATION
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  • Abstract
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  • Application Information

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Problems solved by technology

However, this is resolution at the expense of loss of sensitivit

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  • Multi-reflecting time-of-flight mass spectrometer and a method of use
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  • Multi-reflecting time-of-flight mass spectrometer and a method of use

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[0068] The present invention relates generally to the field of mass spectrometry, and in particular to an instrument comprising a multi-reflection time-of-flight mass spectrometer (MR-TOF MS). More precisely, the present invention improves the resolution and sensitivity of planar and gridless MR-TOF MS by employing a novel arrangement combined with a set of periodic lenses in the drift space to control the mirror electrodes. Due to the improved spatial and temporal focusing, the MR-TOF MS of the present invention has wider reception and reliable confinement of the ion beam along the extended folded ion path. Therefore, the MR-TOF MS of the present invention can be efficiently coupled to a continuous ion source through an ion storage device, thereby saving the duty cycle of ion sampling. The MR-TOF MS of the present invention is proposed for use in tandem mass spectrometers, as the first slow separator in a tandem for two-dimensional parallel MS-MS analysis; or as a tandem with...

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Abstract

A multi-reflection time-of-flight mass spectrometer (MR-TOFMS) and an analysis method are disclosed. The flight paths of the ions are folded along a trajectory through electrostatic mirrors. Longer flight paths provide higher resolution while maintaining a modest instrument size.

Description

technical field [0001] The present invention generally relates to the field of mass spectrometry, and more particularly to a multi-reflection time-of-flight mass spectrometer (MR-TOF MS) and a method of use. Background technique [0002] Mass spectrometry is a well-established tool in analytical chemistry for the identification and quantification of various compounds and mixtures. The sensitivity and resolution of this analysis are critical for practical use. It is well established that the resolution of TOF MS is directly proportional to the length of the flight path. However, it has been recognized that increasing the flight path while keeping the instrument at a reasonable size is difficult. The proposed solution is a multiple reflection time-of-flight mass spectrometer (MR-TOF MS). The use of MR-TOF MS became possible after the introduction of an electrostatic ion mirror with time-of-flight focusing properties. US Patent No. 4,072,862, USSR Patent No. SU198034 and So...

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Application Information

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IPC IPC(8): H01J49/40H01J49/16
CPCH01J49/406G01N27/623
Inventor 阿纳托利·N.·维雷恩特奇科夫米克海尔·雅沃尔乔尔·C.·米切尔维特彻斯拉夫·阿塔伊夫
Owner LECO CORPORATION
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