Method and system for RAM fault testing

A technology for fault testing and memory, applied in static memory, error detection/correction, instruments, etc., can solve the problems of unreliable results of the internal unit of the address bus memory, cannot rule out the existence of internal chip faults of memory address bus faults, etc., to achieve improvement reliability effect
CN1929034AInactive Publication Date: 2007-03-14HUAWEI TECH CO LTD
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Patent Information

Authority / Receiving Office
CN ยท China
Patent Type
Applications(China)
Current Assignee / Owner
HUAWEI TECH CO LTD
Publication Date
2007-03-14
Estimated Expiration
Not applicable ยท inactive patent

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Abstract

The disclosed memory fault testing method comprises: from the target, selecting at least three address units with same bit width as the memory data bus; writing testing vectors into every selected unit to read the back vector for comparison with the original and final fault decision. This invention can ensure the testing accuracy and precision for embedded communication devices.
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Description

technical field

[0001] The invention relates to the field of memory testing, in particular to a method and system for testing memory faults in an embedded communication device system. Background technique

[0002] As shown in Figure 1: In the embedded communication device system, the processor, memory, bootrom and peripheral I / 0 (input / output) devices constitute a basic system. During the design and manufacture of the system, it is necessary to test the interconnection between the various devices that make up the system and the reliability of the devices themselves to diagnose the faults of the hardware system. There are two types of faults in random access memory (Random-Access Memory, RAM): peripheral interconnection faults and chip internal faults. Among them, the failure of peripheral interconnection can be divided into the failure of data bus, the failure of address bus and the failure of control bus. If the system has a failure of the control bus, the memory will bas...

Claims

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