Universal micro-satellite comprehensive testing platform based on PXI system

A technology of micro-satellites and test platforms, applied in the testing of machines/structural components, observation of space vehicles, measurement devices, etc. High degree of automation and intelligence, convenient judgment and maintenance, and ensure the effect of safety protection

Inactive Publication Date: 2007-06-20
SHANGHAI ENG CENT FOR MICROSATELLITES
View PDF0 Cites 71 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 1) The versatility is not strong
[0005] Mainly follow the test method of Dasat. The test equipment includes stand-alone self-test equipment, comprehensive test equipment, etc., which are highly targeted. There are many test equipment but not related to each other. The unity and integrity of measurement and control tasks lack system support. One satellite needs to redevelop a set of comprehensive test equipment
[0006] 2) The degree of automation and intelligence is not high
[0007] In the current...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Universal micro-satellite comprehensive testing platform based on PXI system
  • Universal micro-satellite comprehensive testing platform based on PXI system
  • Universal micro-satellite comprehensive testing platform based on PXI system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050] Referring to Figure 1, the general-purpose micro-satellite comprehensive test platform based on the PXI system is composed of the object under test, the direct measurement and control layer, the central control management layer and the terminal monitoring layer.

[0051] Due to the rapid development of testing technology to virtual technology in recent years. The automatic test system composed of virtual instruments has high reliability and strong flexibility, and the system can be transplanted from one system under test to another system under test through software configuration. VXI and PXI are representatives of virtual instruments, but VXI components are mostly high-end products, and the system is relatively large; PXI is a modular instrument system proposed and promoted by American NI in recent years, which has been widely used in various fields at home and abroad. The virtual software developed by NI Language LABVIEW and LABWINDOWS / CVI enable PXI hardware to obtai...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A universal micro-satellite integrated test platform based on PXI system is formed by interconnecting tested object, direct measurement-control layer, central control management layer and terminal monitoring layer to each other.

Description

technical field [0001] The invention relates to a comprehensive test platform for micro-satellites, especially a general-purpose micro-satellite comprehensive test platform based on the PXI system. The test platform can complete the development of satellites by building a set of intelligent, flexible and comprehensive satellite automatic test systems. In the process, from the scheme simulation test to the impending launch test, the stimulus simulation and test of the whole star and stand-alone are carried out. Background technique [0002] The reduction of satellite development cost and cycle not only depends on the development of satellite technology itself, but also depends to a large extent on the improvement of satellite development tools. Satellite testing technology is an indispensable equipment in the process of satellite research and development. Along with the whole process of satellite research and development, the level of testing equipment represents the level of...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01M19/00B64G3/00G01M99/00
Inventor 孙宁余慧亮丁洲
Owner SHANGHAI ENG CENT FOR MICROSATELLITES
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products