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Test assembly and test device

a test assembly and test device technology, applied in the field of testing technology, can solve the problems of easy damage to existing test element groups during test, and achieve the effect of avoiding deformation and damage to detection pins

Active Publication Date: 2021-05-25
CHONGQING HKC OPTOELECTRONICS TECH CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present patent application provides a test assembly and device for detecting the characteristics of a test key. The test assembly includes a detection pin that is in press contact with the test key, a pressure sensor that detects the pressure applied to the detection pin, and a drive mechanism that outputs a driving force to move the detection pin. The drive mechanism includes a first driver that moves the detection pin when the test key is applied, and a second driver that moves the detection pin to access the test key. The pressure sensor transmits a signal to the first driver when the pressure reaches a predetermined level, and the first driver stops outputting the driving force to prevent damage to the detection pin. The detection pin can be reused to save costs and ensure consistent pressure application, improving the accuracy of detection.

Problems solved by technology

And the existing test element groups are easy to be damaged during test.

Method used

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Embodiment Construction

[0029]In order to make the purpose, the technical solution and the advantages of the present application be clearer and more understandable, the present application will be further described in detail below with reference to accompanying figures and embodiments. It should be understood that the specific embodiments described herein are merely intended to illustrate but not to limit the present application.

[0030]It is noted that when a component is referred to as being “fixed to” or “disposed at” another component, it can be directly or indirectly on another component. When a component is referred to as being “connected to” another component, it can be directly or indirectly connected to another component. Terms “the first” and “the second” are only used in describe purposes, and should not be considered as indicating or implying any relative importance, or impliedly indicating the number of indicated technical features. As such, technical feature(s) restricted by “the first” or “the...

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Abstract

The present application provides a test assembly, including: a detection pin (11), a pressure sensor (12) connected to the detection pin (11), and a drive mechanism (18) configured to drive each detection pin (11), and each pressure sensor (12) is configured to detect the pressure applied to the detection pin (11) in real time.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]This application is the International Application No. PCT / CN2018 / 111645 for entry into US national phase, with an international filing date of Oct. 24, 2018 designating the U.S., now pending, and claims priority benefits to Chinese Patent Application No. 201811072787.7, filed on Sep. 14, 2018, the contents of which being incorporated herein by reference.BACKGROUND OF THE INVENTIONField of the Invention[0002]The present application relates to the technical field of testing technology, and more particularly to a test assembly and a test device.Description of Related Art[0003]Thin film transistor (TFT) is main drive element in current Liquid Crystal Display (LCD) and Active Matrix Organic light-emitting diode (AMOLED), and directly affect the display performance of a panel display device.[0004]Both the LCD and the AMOLED include a TFT array substrate. Generally, in the product manufacturing stage of the display panel, in order to monitor the...

Claims

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Application Information

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Patent Type & Authority Patents(United States)
IPC IPC(8): G01R31/26H01L21/66G09G3/00G06T7/55G05D17/02
CPCG01R31/2621G09G3/006H01L22/32G05D17/02G06T7/55G06T7/0004G06T2207/30121
Inventor QIU, TIANHUI
Owner CHONGQING HKC OPTOELECTRONICS TECH CO LTD