Mask and method of manufacturing the same, electro-luminescence device and method of manufacturing the same, and electronic instrument
a manufacturing method and mask technology, applied in the field of masks and manufacturing methods, electroluminescence devices and their manufacturing methods, and electronic instruments, can solve the problems of difficult to manufacture masks with high precision in the conventional method
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first embodiment
[0106] First Embodiment
[0107]FIGS. 1A to 1C are diagrams illustrating a mask in accordance with one embodiment of the present invention. FIG. 1B is a sectional view taken along an IB-IB line of FIG. 1A. FIG. 1C is a partially enlarged view of FIG. 1B. The mask has a monocrystal substrate 10 (or is formed by only the monocrystal substrate 10). For example, the monocrystal substrate 10 is a monocrystal silicon substrate, or may be a silicon wafer. The monocrystal substrate 10 has surfaces having Miller indices {110}. For example, the top and bottom surfaces of the monocrystal substrate 10 are {110} planes. The {110} planes includes a plurality of planes equivalent to a (110) plane. In a cubic lattice, directions perpendicular to the {110} planes are directions.
[0108] The monocrystal substrate 10 includes at least one (e.g., plural) thin portion 12. A plurality of the thin portions 12 may be provided in a matrix. The monocrystal substrate 10 except the thin portion 12 is a thick port...
second embodiment
[0124] Second Embodiment
[0125]FIGS. 4A to 4C are diagrams illustrating a method of manufacturing a mask in accordance with a second embodiment of the present invention. In the first embodiment, the openings 22 are formed in the etching resistant film 20 on opposite surfaces of the monocrystal substrate 10. In this case, since it is difficult to align the positions of the openings 22 on opposite sides, a method for simply aligning these positions will next be mainly explained.
[0126] As shown in FIG. 4A, a first opening 34 is formed in an etching resistant film 30 formed on one surface of the monocrystal substrate 10, and a second opening 36 is formed in an etching resistant film 32 formed on the other surface. Here, the widths A, B of the first and second openings 34, 36 have the relationship: B36 inside a projecting area of the first opening 34. Its positioning is simpler than the alignment of the openings of the same size. Thus, the first opening 34 on one side and the second open...
third embodiment
[0127] Third Embodiment
[0128]FIG. 5 is a diagram illustrating a method of manufacturing a mask in accordance with a third embodiment of the present invention. In the first embodiment, the thickness W1 (see FIG. 1C) of the monocrystal substrate and the length L of a long side of the parallelogram of the opening 22 of the etching resistant film 20 (the same as the length L of a long side of the parallelogram of the penetrating hole 18 shown in FIG. 2A) have the relationship: {square root}3×W1<L. The penetrating hole can be formed in such a comparatively thin monocrystal substrate. However, in a monocrystal substrate thicker than this comparatively thin monocrystal substrate, the etching is intermediately stopped so that no penetrating hole can be formed.
[0129] In this embodiment, the forming method of the penetrating hole will be explained when the relationship: {square root}3×W1≧L is formed (when the monocrystal substrate is thick).
[0130] As shown in FIG. 5, a small penetrating hol...
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Abstract
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