Test apparatus and test method

Abstract

A test apparatus for testing a device under test including a receiving circuit for receiving signals transmitted through a communication cable is provided. The test apparatus includes: an waveform generating section for outputting waveform data to define an waveform to be provided to an input terminal of a receiving circuit; a digital filter having the filter characteristic substantially reverse to the attenuation characteristic of the communication cable, for outputting amplified waveform data obtained by amplifying the waveform data; a DA converter for converting the amplified waveform data to an analog waveform; and a low-pass filer having the attenuation characteristic substantially the same as that of the communication cable, for attenuating the analog waveform and providing the same to the receiving circuit.

Description

BACKGROUND OF THE INVENTION [0001] 1. Field of the invention [0002] The present invention relates to a test apparatus and a test method. Particularly, the present invention relates to a test apparatus and a test method for testing a device under test including a receiving circuit for receiving signals transmitted through a communication cable. [0003] 2. Related Art [0004]FIG. 1 shows communication devices 210 and 220, and a communication cable 200 for 10Gbase-T. Recently, it have been made advance to standardize 10Gbase-T (IEEE802.3an) being capable of speedily transmitting at 10Gbpt as a next-generation Ethernet (registered trademark) standard. A communication network system for the 10Gbase-T can communicate by connecting a twisted pair communication cable 200 with the maximum length 100 m of four lines between a transmitting circuit 230 and a receiving circuit 240. [0005] Here, testing a communication device, a test apparatus generates a signal waveform to be received by the recei...

AI Technical Summary

Benefits of technology

[0009] the minimum voltage step of converting by the DA converter may be larger than the maximum voltage of the analog waveform provided from the low-pass filter to the receiving circuit. The communication cable may include a plurality of transmission paths. The receiving circuit may include a plurality of input terminals for receiving signals from each of the plurality of transmission paths, respectively. The waveform generating section may output a plurality of waveform data which should be provided to the plurality of waveform data and which include an effect of the interference generated in the plurality of transmission paths. The test apparatus further include a simulation section for calculating by simulating a receiving waveform inputted to the input terminal of the receiving circuit after an output signal of the transmitting circuit for transmitting signals to the receiving circuit through the communication cable is passed through the communication cable. The waveform generating section may acquire digital data of the receiving waveform and output the acquired digital data as waveform data.

Problems solved by technology

However, such DA converter with the high resolution is very expensive and large in size.

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