Test equipment for verification of crystal linearity at high-flux levels
a technology of crystal linearity and test equipment, applied in the field of xray detector crystals, can solve the problems of leakage current and noise in the detector network, and achieve the effect of optimizing life and reliability and efficient operation
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[0027]The present invention is described with reference to the accompanying FIGS. 1 through 5, where like reference numbers correspond to like elements.
[0028]FIGS. 1 through 4 are partial drawings of an x-ray detector assembly. In FIGS. 1 and 3, only a portion of the outer enclosure 210 is shown for clarity. It is understood that additional electronics, well known to those versed in the art, have been omitted from the drawings for clarity.
[0029]FIG. 1 is a cross-sectional view of the invention. Air-flow is substantially two-dimensional and in the cutting plane used to produce this view. The temperature of the package housing the photon counting electronics 110 is cooled while the detector crystals 120 are maintained within a narrow range of temperatures. In one embodiment the temperature of crystals 120 is controlled to within ±2° C. However, tighter control, to within ±0.5° C., is desirable.
[0030]The detector crystals 120 are isolated within insulating enclosure 210. In a preferred...
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