Readout circuit for uncooled infrared focal plane array

Active Publication Date: 2015-07-09
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0009]An object of the present invention is to provide a readout circuit for an uncooled infrared focal plane

Problems solved by technology

However, TEC has a certain volume and power consumption, which limits the application of uncooled infrared focal plane array detector.
However, in the microbolometer infrared imaging system without TEC, non-ideal effects such as extreme non-uniformity and non-linearity of the focal plane array will be

Method used

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  • Readout circuit for uncooled infrared focal plane array
  • Readout circuit for uncooled infrared focal plane array
  • Readout circuit for uncooled infrared focal plane array

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Embodiment Construction

[0066]Referring to the drawings, a readout circuit for an uncooled infrared focal plane array according to a preferred embodiment of the present invention is illustrated.

[0067]FIG. 1 is a schematic view of a readout circuit for an uncooled infrared focal plane array according to the preferred embodiment of the present invention.

[0068]Referring to the FIG. 1 of the drawings, a readout circuit for an uncooled infrared focal plane array according to the preferred embodiment of the present invention is illustrated, comprising:

[0069]a first biasing circuit 10;

[0070]a second biasing circuit 20;

[0071]a first integration circuit 30; and

[0072]an analog-to-digital circuit 50.

[0073]According to the preferred embodiment, the first biasing circuit 10 is connected to an active microbolometer unit. Usually, a plurality of the active microbolometer units is provided in the uncooled infrared focal plane array, and is arranged in a form of array for detecting incident infrared radiation. According to...

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Abstract

A readout circuit for an uncooled infrared focal plane array includes: a first biasing circuit for generating a detection output signal; a second biasing circuit for generating a first reference output signal; a first integration circuit; and an analog-to-digital circuit including: a ramp signal generating circuit for generating a ramp signal according to a second reference microbolometer of a third biasing circuit. In the readout circuit, subtracting and amplifying the detection output signal and the first reference output signal are provided by the integrator at an analog domain, while ratio counting is provided by an analog-to-digital converter during analog-to-digital conversion. Furthermore, a column level integrated readout channel utilizes only one reference microbolometer, and the chip level ramp signal generator also utilizes only one reference microbolometer. Therefore, a chip area is further saved, and noise sources are decreased.

Description

CROSS REFERENCE OF RELATED APPLICATION[0001]The present invention claims priority under 35 U.S.C. 119(a-d) to CN 201410008992.2, filed Jan. 9, 2014.BACKGROUND OF THE PRESENT INVENTION[0002]1. Field of Invention[0003]The present invention relates to a technique field of infrared focal plane arrays, and more particularly to a readout circuit for an uncooled infrared focal plane array.[0004]2. Description of Related Arts[0005]If a microbolometer infrared imaging system, as one kind of thermal infrared detector, is not compensated by special methods, a detection result thereof is associated with the substrate temperature. In practice, infrared detection results are expected to be only associated with the temperature of the object, and independent of other factors.[0006]The thermo-electric cooler (TEC for short) utilized in the conventional uncooled microbolometer infrared imaging system compensates the substrate temperature. However, TEC has a certain volume and power consumption, which...

Claims

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Application Information

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IPC IPC(8): G01J5/10
CPCG01J5/10G01J5/20G01J5/22G01J2005/106H04N5/33H04N25/671
Inventor LV, JIANQUE, LONGCHENGZHOU, YUNWEI, LINHAIJIANG, YADONG
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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