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Problems solved by technology
The test data not only determine whether the components function properly, but also may indicate deficiencies in the manufacturing process.
Gathering and analyzing test data is expensive and time consuming.
Because each tester is testing 100 or more components an hour and several testers may be connected to the same server, an enormous amount of data must be stored.
Storage in a conventional database, however, requires further storage capacity as well as time to organize and store the data.
Furthermore, acquiring the test data presents a complex and painstaking process.
The program tends to be very complex to ensure full and proper operation of the component.
Consequently, the test program for a moderately complex integrated circuit involves a large number of tests and results.
Preparing the program demands extensive design and modification to arrive at a satisfactory solution, and optimization of the program, for example to remove redundant tests or otherwise minimize test time, requires additional exertion.
The analysis of the gathered data is also dif
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Embodiment Construction
[0059]The present invention may be described in terms of functional block components and various process steps. Such functional blocks and steps may be realized by any number of hardware or software components configured to perform the specified functions. For example, the present invention may employ various testers, processors, storage systems, processes, and algorithms, e.g., statistical engines, memory elements, signal processing elements, neural networks, pattern analyzers, logic elements, programs, and the like, which may carry out a variety of functions under the control of one or more testers, microprocessors, or other control devices. In addition, the present invention may be practiced in conjunction with any number of test environments, and each system described is merely one exemplary application for the invention. Further, the present invention may employ any number of conventional techniques for data analysis, component interfacing, data processing, component handling, ...
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Abstract
A method and apparatus for data analysis according to various aspects of the present invention is configured to test a set of components and generate test data for the components. A diagnostic system automatically analyzes the test data to identify a characteristic of a component fabrication process by recognizing a pattern in the test data and classifying the pattern using a neural network.
Description
CROSS-REFERENCES TO RELATED APPLICATIONS[0001]The present application is:[0002]a continuation of U.S. patent application Ser. No. 13 / 044,202 filed on Mar. 9, 2011, entitled METHODS AND APPARATUS FOR DATA ANALYSIS, which is a continuation-in-part of U.S. patent application Ser. No. 12 / 573,415, filed on Nov. 5, 2009, entitled METHODS AND APPARATUS FOR DATA ANALYSIS, which is a continuation of U.S. patent application Ser. No. 12 / 021,616, filed on Jan. 29, 2008, now abandoned, entitled, METHODS AND APPARATUS FOR DATA ANALYSIS, which is a continuation of U.S. patent application Ser. No. 11 / 053,598, filed on Feb. 7, 2005, now U.S. Pat. No. 7,356,430 entitled METHODS AND APPARATUS FOR DATA ANALYSIS, which:[0003]claims the benefit of U.S. Provisional Patent Application No. 60 / 542,459, filed Feb. 6, 2004, entitled EVOLVING NEURAL NETWORKS USING SWARM INTELLIGENCE FOR BINMAP CLASSIFICATION;[0004]claims the benefit of U.S. Provisional Patent Application No. 60 / 546,088, filed Feb. 19, 2004, ent...
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