Unlock instant, AI-driven research and patent intelligence for your innovation.

Method for operating low-current eeprom array

a low-current, eeprom technology, applied in the field of memory arrays, can solve the problems of increasing the cost of using eeprom, inconvenient application of flash memory architecture, and not allowing erasing or programming single one-bit memory cells

Active Publication Date: 2020-04-16
YIELD MICROELECTRONICS CORP
View PDF4 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present invention provides a way to operate a low-current EEPROM array with low-current, low-voltage, and low-cost. A special bias is used to achieve the writing and erasing of bytes. This method allows for efficient and effective use of EEPROM arrays in various applications.

Problems solved by technology

However, the flash memory architecture does not allow erasing or programming a single one-bit memory cell but allows erasing or programming a block of the memory.
Therefore, the flash memory architecture is inconvenient in application.
Thus, the cost of using EEPROM is increased.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for operating low-current eeprom array
  • Method for operating low-current eeprom array
  • Method for operating low-current eeprom array

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020]Refer to FIG. 3 and FIG. 4 for a first embodiment of the present invention. The method for operating a low-current EEPROM array is applied to a low-current EEPROM array. The low-current EEPROM array comprises a plurality of parallel bit lines 14; a plurality of parallel word lines 20; a plurality of parallel common source lines 26; and a plurality of sub-memory arrays 30. The bit lines 14 are divided into a plurality of bit line groups 16, including a first bit line group 18. The first bit line group 18 includes two bit lines 14. The word lines 20 are vertical to the bit lines 14 and include a first word line 22 and a second word line 24. The common source lines 26 are parallel to the word lines 20 and include a first common source line 28. The bit lines 14, the word lines 20 and the common source lines 26 are connected with sub-memory arrays 30 each containing 2×1 pieces of memory cells. Each sub-memory array 30 is connected with one bit line group 16, two word lines 20 and o...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method for operating a low-current EEPROM array is disclosed. The EEPROM array comprises bit line groups, word lines, common source lines, and sub-memory arrays. Each sub-memory array includes a first memory cell and a second memory cell. The first memory cell is connected with one bit line of a first bit line group, a first common source line, and a first word line. The second memory cell is connected with the other bit line of the first bit line group, the first common source line, and a second word line. The first and second memory cells are operation memory cells and symmetrically arranged at two sides of the first common source line. The method uses special biases to perform the bytes writing and erasing with low current, low voltage and low cost.

Description

BACKGROUND OF THE INVENTIONField of the Invention[0001]The present invention relates to a memory array, particularly to a method for operating a low-current EEPROM (Electrically Erasable Programmable Read Only Memory) array.Description of the Related Art[0002]The CMOS (Complementary Metal Oxide Semiconductor) technology has been a normal process for fabricating ASIC (Application Specific Integrated Circuit). Flash memories and EEPROM (Electrically Erasable Programmable Memory) have been widely used in electronic products because their data will not volatilize but can be erased and programmed electrically.[0003]Non-volatile memories are programmable, storing charges to vary gate voltages of transistors, or not storing charges to preserve the original gate voltages of transistors. In erasing a non-volatile memory, the charges stored in the non-volatile memory are eliminated to resume the initial state of the memory. The flash memory architecture has advantages of small size and low co...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G11C16/10G11C16/14
CPCG11C16/107G11C16/102G11C16/14G11C16/24G11C16/0425G11C16/10G11C16/08H10B12/20
Inventor LIN, HSIN-CHANGCHUNG, CHENG-YUHUANG, WEN-CHIEN
Owner YIELD MICROELECTRONICS CORP