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Method and circuit for measuring same-frequency signal phase difference using fixed phase shift

A fixed phase-shift, same-frequency signal technology, applied in the field of signal processing, to achieve the effect of setting and resetting, avoiding zero-point drift, and having clean signal edges

Inactive Publication Date: 2009-04-22
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] The purpose of the present invention is to overcome the deficiencies of the existing measurement methods, on the basis of the zero-crossing method, to propose a new way to deal with the problem of measuring the phase difference in the time domain

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  • Method and circuit for measuring same-frequency signal phase difference using fixed phase shift
  • Method and circuit for measuring same-frequency signal phase difference using fixed phase shift
  • Method and circuit for measuring same-frequency signal phase difference using fixed phase shift

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Embodiment Construction

[0040] Such as figure 1 , is a schematic diagram comparing the principles of the present invention and the traditional zero-crossing method. In the traditional zero-crossing method, the phase difference between two sinusoidal signals of the same frequency, that is, the reference signal and the measurement signal, can be characterized by their corresponding zero-crossing time difference, and the signal is shaped into a rectangular wave signal directly by judging the zero-crossing point, and then the The obtained two rectangular wave signals are XORed to obtain a pulse signal, and the width of the pulse signal is the measured phase difference. In the present invention, the reference signal and the measurement signal undergo the same phase shift respectively, and are shaped together with the original signal to become a rectangular wave signal, whose front and rear edges correspond to the positive intersection and negative intersection of the original signal and its phase-shifted ...

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Abstract

The invention relates to signal processing technical field, in particular to a method for using fixed phase shift to measure the phase difference of common-frequency signal, and a relative circuit, wherein the method comprises that shifting same phase of two sine signals in common-frequency as a reference signal and a measured signal, to be rectified with a former signal into two rectangle signals, processing exclusive-OR operation on the two rectangle signals to obtain a pulse signal which width is the time difference between the zero-cross points of the reference signal and the measured signal, to be converted into measured phase difference. And the generating circuit of rectangle signal comprises a phase-shift circuit, a comparing circuit, and a TTL converting circuit. The invention can avoid zero-shift caused by the temperature shift of the operation amplifier, to quickly set and reset the rectangle signal, without affected by signal amplitude, with the application in the phase-difference measurement of common-frequency period signal.

Description

technical field [0001] The invention belongs to the technical field of signal processing, in particular to a method and a circuit for measuring the phase difference of signals of the same frequency by using a fixed phase shift. Background technique [0002] Phase difference measurement of periodic signals with the same frequency is widely used in signal analysis, circuit parameter testing, electrical technology, industrial automation, intelligent control, communication and electronic technology, etc. Determination of power factor angle, etc. [0003] There are many methods of phase difference measurement: traditional methods relying on analog devices, such as vector method, diode phase detection method, pulse counting method, etc., the measurement system is complex, special devices are required, and the hardware cost is high; in recent years, computers and digital signal processing The technology has made great progress, and the phase difference measurement is gradually dev...

Claims

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Application Information

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IPC IPC(8): G01R25/00
Inventor 鲁华祥马晓燕李宁
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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