Probe card capable of transmitting differential signal pairs

Abstract

The present invention is a probe card capable of transmitting differential signal pairs, comprising a circuit board and a plurality of differential probes, the circuit board is provided with an electronic circuit, the electronic circuit has a plurality of first and second wires, the first wire It is adjacent in pairs and is provided with at least one second wire around it, and the second wire is electrically grounded; each differential probe has two needles and a coaxial line, and the coaxial line includes two signal lines and a sleeve, and the two One end of the signal line is provided with each needle, and the other end is electrically connected to a pair of adjacent first wires, and the sleeve is electrically connected to each second wire, the adjacent two first wires and the two signal wires connected to each other. The wires maintain the same impedance matching; each needle is in electrical contact with the electronic component, and the probe card can transmit a differential signal to the electronic component.

Description

technical field [0001] The present invention relates to a probe card, in particular to a probe card capable of transmitting paired differential signals. Background technique [0002] General probe cards are designed to facilitate the mass production testing of semiconductor production lines. They provide probes with corresponding test contacts for the circuit design of the electronic components to be tested. They are used as the transmission medium for outputting or receiving test signals. There are very few practical considerations. For the electrical operation function of electronic components, the circuit design of the probe card is matched with the characteristics of the measurement signal to provide the electrical measurement conditions actually required by the electronic components. [0003] Especially for the display panels produced by the optoelectronic industry, the general display panels use high-frequency scanning signals to drive the display screen, and the drive...

AI Technical Summary

Problems solved by technology

[0003] Especially for the display panels produced by the optoelectronic industry, the general display panels use high-frequency scanning signals to drive the display screen, and the driver chips used to output high-speed, low-noise and low-electromagnetic interference differential signal (Differential Signaling) At the same time, the quality and reliability of the electronic components in the drive chip are more necessary conditions. For this reason, the chip supplier needs to ensure the shipment quality of the electronic components, so that these electronic components pass accurate electrical tests, so During the electrical measurement process, the test signal must be stable and accurate without distortion, so as to provide the actual electrical measurement conditions required by the electronic components; the differential signal used to test the above-mentioned electronic components must be a set of signal pairs with the same current magnitude and opposite flow directions. Signal pairs have specific impedance matching and electrical coupling effects to each other. Therefore, the existing probe card only considers the circuit design corresponding to the test contact of the component under test, and cannot maintain the circuit for transmitting differential signals. Its characteristic impedance matching and electrical coupling effect can only test whether the components are normal or not, but it is impossible to judge whether the components can operate within the required electrical specifications, which makes them lose the reliability of electrical testing

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