Function testing system

Abstract

A functional test system, comprising a signal acquisition circuit, a signal processing circuit, a single-chip microcomputer system, a multi-channel signal selection switch, an IIC bus circuit, and a storage device storing an automatic test program; the functional test system passes through the signal acquisition circuit Useful signals are collected, and the part processed by the signal processing circuit is sent to the single-chip system for processing, and finally communicates with the automatic test program of the storage device in the main board under test through the IIC circuit. The single-chip microcomputer system will cooperate with each other according to the automatic test program in the storage device to achieve the final effect of high efficiency and automatic testing; in addition, the single-chip microcomputer system is connected to the computer through the RS232 circuit, and the test status can be transmitted to the computer to realize computer test monitoring.

Description

technical field [0001] The invention relates to a function test system, in particular to a main board function automatic test system. Background technique [0002] One link after the main board is assembled is the function test, which tests the normal use function of the main board to determine whether the main board can work normally. Motherboard testing usually uses a motherboard testing device to detect various functional errors that may occur on the motherboard, and uses a display screen to display various functional errors, which is convenient for testing personnel to find various functional errors and facilitate maintenance. [0003] The previous main board function test equipment required many steps of manual participation. The operator first needs the operator to place the main board to be tested on the test equipment. A choice test. Due to too many manual actions, the operator is prone to fatigue during the long-term operation process and may miss some functional ...

AI Technical Summary

Problems solved by technology

[0003] The previous motherboard function test equipment required many steps of manual participation. The operator first had to place the tested motherboard on the test equipment. After the peripherals were installed, all the items to be tested had to be manually separated a choice test

Due to too many manual actions, the operator is prone to fatigue during the long-term operation process, resulting in missing some functional phenomena, so there is a quality risk, and the work efficiency is relatively low

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