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4f phase coherent imaging method based on michelson interferometer

A technology of phase coherence and imaging method, applied in the field of nonlinear photonics materials and nonlinear optical information processing, can solve the problems of high noise and laser stability requirements, complex data processing, small deformation range, etc. Simple quality and optical path requirements, simple data processing, and easy data processing effects

Inactive Publication Date: 2009-08-26
HARBIN INST OF TECH
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Problems solved by technology

[0005] The present invention solves the troublesome data processing of the traditional 4f system coherent imaging technology, the unavoidable nonlinear absorption, and the small deformation range of the Mach-Zehnder interferometry, which requires high noise and laser stability. For complex and large error problems, a 4f phase coherent imaging method based on Michelson interferometer is provided

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  • 4f phase coherent imaging method based on michelson interferometer
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  • 4f phase coherent imaging method based on michelson interferometer

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specific Embodiment approach 1

[0022] Specific implementation mode one: see Figure 1 to Figure 5, the method for completing the present embodiment adopts the device of following structure, and this device is by the first linear attenuation plate 1, the first total reflection mirror 2, the first aperture stop 3, the second total reflection mirror 4, the second aperture stop 5 , the first beam splitter 6, the second beam splitter 7, the first convex lens 8, the second convex lens 10, the second linear attenuation sheet 11, the third beam splitter 12, the CCD camera 13, the third convex lens 14, the third total reflection mirror 15. The fourth total reflection mirror 18, the fourth convex lens 19, the fifth convex lens 20 and the laser 21 are composed of the fourth convex lens 19, the first linear attenuation sheet 1, the fifth convex lens 20, the first beam splitter 6, and the second aperture light The stopper 5 and the second total reflection mirror 4 are all arranged successively on the central axis of the...

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Abstract

The coherent imaging method of 4f position based on the Michelson's interferometer is the nonlinear refractive method of 4f position coherent imaging measuring medium based on the Michelson's interferometer. It can solves the problem of data treating bother, nonlinear absorption of traditional 4f coherent imaging technology and the small deform range, high request for stability and complex data treating of Mach-Zehnder interference. The method is composed of the processes: one: starting and adjusting the device; two: collecting the image without image; three: collecting the linear image; four: collecting the nonlinear image; five: computing the linear penetrant ratio; six: computing the nonlinear phase movement; seven: computing the third-order nonlinear refraction coefficient.

Description

technical field [0001] The invention relates to a method for measuring the nonlinear refraction property of a medium based on a Michael interferometer-based 4f coherent phase imaging technology, and belongs to the fields of nonlinear photonic materials and nonlinear optical information processing. Background technique [0002] With the rapid development of optical communication and optical information processing and other fields, the research of nonlinear optical materials is becoming more and more important. The realization of functions such as optical switching, phase complex conjugation, optical limiting, and optical modulation mainly depends on the research progress of nonlinear optical materials, and optical nonlinear measurement technology is one of the key technologies for studying nonlinear photonic materials. At present, the commonly used methods for measuring nonlinear optical parameters include Z-scan, 4f system coherent imaging technology, Mach-Zehnder interferom...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/45G06F19/00
Inventor 李云波潘广飞宋瑛林杨昆王玉晓张学如
Owner HARBIN INST OF TECH
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