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A making method for diffusing blocking layer

A production method and barrier layer technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve the problems of reduced production efficiency, numerous production steps, and low production capacity, so as to improve production efficiency, simplify process steps, and improve performance effect

Inactive Publication Date: 2013-06-05
SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT
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  • Description
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  • Application Information

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Problems solved by technology

[0004] The diffusion barrier layer prepared by the above-mentioned common physical sputtering method is easy to form at the entrance of the contact hole such as figure 1 The overhang 1 shown is easy to form when the plug is made in the contact hole later as figure 2 Void 2 shown, which will affect the performance of semiconductor devices
In addition, the production steps are numerous, which reduces the production efficiency
[0005] In order to overcome the problems encountered in the above-mentioned titanium nitride film prepared by the common physical sputtering method, metal oxide chemical vapor deposition (MOCVD) can be used to make a titanium nitride film with good physical morphology, but the metal oxide The equipment and raw materials used in chemical vapor deposition are very expensive, and its production capacity is low, which cannot meet the needs of large-scale industrial production.

Method used

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  • A making method for diffusing blocking layer
  • A making method for diffusing blocking layer
  • A making method for diffusing blocking layer

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Embodiment Construction

[0020] The fabrication method of the diffusion barrier layer of the present invention will be further described in detail below.

[0021] Such as image 3 As shown, the manufacturing method of the diffusion barrier layer of the present invention firstly performs step S30, depositing a titanium film on the wafer with contact holes. In this embodiment, the titanium film can be deposited by metal ionization sputtering method, or the titanium film can be deposited by common physical sputtering method, and then the titanium film is bombarded by inert gas ions. Then continue to step S31.

[0022] In step S31, nitriding treatment is performed on the titanium film to form a titanium nitride film on the surface of the titanium film. In this embodiment, the nitriding treatment temperature is lower than 100 degrees Celsius, and a bias voltage for orienting nitrogen ions is formed on the wafer substrate. Then continue to step S32.

[0023] In step S32, in-line annealing treatment is p...

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Abstract

The related preparation method for diffusion-barrier layer comprises: depositing metal film on a wafer with contact hole, nitrifying the film with nitrogen plasma to form a corresponding nitride film on the metal film, and annealing. This invention overcomes defects in prior art, forms well physical appearance, and improves device performance greatly.

Description

technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a method for manufacturing a diffusion barrier layer. Background technique [0002] Before filling the contact hole to form a metal plug, in order to prevent the metal from diffusing or migrating into silicon or silicon dioxide to form a deep energy level and affect the performance of the semiconductor device, it is necessary to make a barrier on the contact hole to prevent the metal from diffusing to Diffusion barrier in silicon or silicon dioxide. [0003] Titanium / titanium nitride film is the diffusion barrier layer commonly used today. When making the diffusion barrier layer, it is necessary to use metal ionization sputtering technology to make titanium ions bombard while depositing under the bias of the bottom of the substrate. , so as to form a titanium film with better physical morphology; or use ordinary physical vapor deposition technology to deposit titanium ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/768H01L21/321H01L21/28
Inventor 康晓旭
Owner SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT