Weak-signal detector for acoustic image based on atomic force microscope
An atomic force microscope and acoustic imaging technology, applied in the field of acoustic imaging systems, can solve problems such as inability to achieve acoustic imaging and inability to work, and achieve the effects of reducing production costs, strengthening processing capabilities, and reducing functions
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Embodiment 1
[0031] Application of atomic force microscope acoustic imaging system to test PMN-PT artificial lens material, Figure 6The results of the test are shown. Among them, the picture (a) is the topographic AFM image of the sample, which is the original function of the atomic force microscope. The picture (b) is the SPAM image reflecting the internal structure of the sample in situ by the built-up acoustic imaging system. Obviously, there is a big difference between (a) and (b), and (b) clearly presents the internal unique domain structure of the sample. The orientation and size of the fingerprint-like domains all carry the intrinsic information of the properties of the sample.
Embodiment 2
[0033] The acoustic imaging system of atomic force microscope was used to test the semiconductor ZnO ceramic material. Figure 7 The results of the test are shown. Similar to the above example 1, the picture (a) is the topographic image of the tested sample, and the picture (b) is the acoustic image reflecting the subsurface of the sample. The clear internal structure of the sample shown in Figure (b) is extremely useful for the study of material properties.
Embodiment 3
[0035] The PZT thick film material was tested by the acoustic imaging system of the atomic force microscope. Figure 8 for the test results. Similar to Example 1 above, (a) is the topographic image of the sample, and (b) is the acoustic image reflecting the internal structure of the sample. The grain boundary of the sample shown in (b) is clearer than that in (a). And that's what the Materials Research Institute is looking at.
[0036] The above example shows that the acoustic imaging system constructed by applying the instrument of the present invention on the atomic force microscope expands the function of microscopic imaging of the internal structure of the sample. It has become an important tool for the current development of nanotechnology, and promotes various in-depth research on materials.
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