High concentration super fine granule measuring device and method based on backward photon related spectrum
A related spectrum and ultra-fine particle technology, applied in the field of high-concentration ultra-fine particle measurement devices, can solve problems such as inapplicability to high concentrations, and achieve the effects of reducing multiple scattering, high measurement accuracy, and cost reduction
Inactive Publication Date: 2008-02-13
UNIV OF SHANGHAI FOR SCI & TECH
View PDF0 Cites 17 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Photon correlation spectroscopy measures the particle size by calculating the autocorrelation function of the scattered light intensity, but the traditional method is not suitable for high concentrations due to the use of a 90-degree measuring light path
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
specific Embodiment
[0040] The light intensity autocorrelation curve that adopts digital correlator operation to obtain, its exponential decay law is: ln[G(τ)]=-1693τ, according to the pulse signal of digital correlator 14 pairs of photomultiplier tube output, pass expression is: G (τ)=1+exp(-2Γτ), the attenuation line width can be obtained as: Γ=846s -1 .
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Property | Measurement | Unit |
---|---|---|
particle diameter | aaaaa | aaaaa |
wavelength | aaaaa | aaaaa |
particle diameter | aaaaa | aaaaa |
Login to View More
Abstract
The invention relates to a high concentration superfine particle measurement device and method based on a backward photon correlation spectrum. An incident light path consists of a laser, a pane mirror, a lens group, a pinhole aperture and a sample cell. A receiving light path consists of a sample cell, a lens group and a pinhole aperture. An acquisition and processing unit of scattering signals consists of a light detector, a digital correlator and a computer. The measurement steps include that firstly, the laser is used as a light source to irradiate the sample cell filled with particles. Secondly, a photomultiplier is used as a light detector to continuously measure the scattering signals with a scattering angle of 180 degrees. Thirdly, the digital correlator is used to calculate pulse signals output by the photomultiplier and an autocorrelation function, which are input into a computer. Fourthly, the computer works out the diameter of a particle. The invention has the advantages of high precision, fast speed and on-line measurement. Common optical elements are adopted in the light path part. Therefore, the cost of the device is greatly lowered and the device is easy to be maintained.
Description
technical field [0001] The invention relates to a high-concentration ultrafine particle measuring device and method, in particular to a high-concentration ultrafine particle measuring device and method using photon correlation spectroscopy. Background technique [0002] In dynamic light scattering (Dynamic Light Scattering, DLS) measurement of ultrafine particles, photon correlation spectroscopy (Photon Correlation Spectroscopy, PCS) has become a standard method for characterizing ultrafine particles in dilute solutions. However, the general PCS method requires dilution of the tested sample before measurement to avoid multiple scattering. This causes problems such as the easy change of sample composition, the decrease of signal-to-noise ratio, and the interference of external environmental factors (such as dust, light), etc., so it cannot be popularized and applied in online real-time measurement. [0003] In view of this problem, there are currently several methods with re...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/00G01N21/25
Inventor 郑刚杨晖李孟超
Owner UNIV OF SHANGHAI FOR SCI & TECH
Who we serve
- R&D Engineer
- R&D Manager
- IP Professional
Why Patsnap Eureka
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com