Double light beam laser interferometry method of material thermal expansion coefficient
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- UNIV OF SCI & TECH BEIJING
- Publication Date
- 2008-03-12
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to the field of thermal expansion measurement of materials, and in particular provides a double-beam laser interferometric method for thermal expansion coefficient of materials. Background technique
[0002] The coefficient of thermal expansion is one of the important parameters in the physical properties of materials, and the determination of the coefficient of thermal expansion of solids has important practical significance. The difficulty in measuring the coefficient of thermal expansion is how to accurately determine the change in length of a solid as the temperature changes. At present, the equipment for measuring the thermal expansion of materials mainly includes the single-beam laser interferometry dilatometer based on the basic principle of Michelson interferometry and the dilatometer using the sensor displacement induction method.
[0003] The Michelson thermal expansion interferometer is a precision optical instrument t...