Dielectric materials high-temperature complex dielectric constant measurement method based on terminal short circuit method

A technology of complex permittivity and terminal short-circuit method, applied in microwave and millimeter wave fields, can solve the problems of large test error, increase of complex permittivity test error, inability to accurately measure the size of the test waveguide section and microwave loss, etc.
CN101158702AInactive Publication Date: 2008-04-09UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
UNIV OF ELECTRONICS SCI & TECH OF CHINA
Publication Date
2008-04-09
Estimated Expiration
Not applicable · inactive patent

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Abstract

The present invention provides a medium material high-temperature complex permittivity measurement method based on terminal short circuit and pertains to technology of microwave and millimeter wave dielectric material complex permittivity measurement. When the present invention adopts the terminal short circuit for measurement of high-temperature medium material complex permittivity, a heat dissipation wave guide, a heat insulation waveguide, a high-temperature waveguide with a certain length, and a coupling device, a short circuit board are together constitute a reactive type resonator, and dimensions and microwave loss of the resonator under different temperature can be obtained by measurement of resonance frequency and quality factor of the resonator, and the complex permittivity of the medium material under the temperature can be further measured. The present invention is suitable for the measurement of the medium material high-temperature complex permittivity of various frequency band based on the terminal short circuit, and meanwhile the present invention can measure the dimension and the microwave loss of the waveguide resonator under different temperature. As the present invention considers the changing of the dimension and the microwave loss of the waveguide resonator caused by the influence of the temperature, the present invention has higher measurement accuracy and smaller error.
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Description

Technical field

[0001] The invention belongs to the technical field of microwaves and millimeter waves, and particularly relates to the complex permittivity test technology of microwave and millimeter wave dielectric materials. Background technique

[0002] Microwave and millimeter wave dielectric materials are widely used in microwave and millimeter wave devices and systems. The research and application of dielectric materials and their performance evaluation must pass the actual test of their performance parameters. The complex dielectric constant is a basic parameter of microwave and millimeter wave media. They are the main basis for evaluating the microwave performance of dielectric materials and are also important parameters for the design of microwave devices. The terminal short-circuit method has the advantages of simple test fixture, wide test frequency range, small sample size, etc. It is commonly used to test the complex permittivity of microwave and millimeter wave die...

Claims

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