Probe short circuit preventing structure

Abstract

The invention provides a probe short-circuit prevention structure which is an insulated separation structure; each separation structure can be embedded in a probe body or a corresponding position of a probe seat, which is at the interval of the probes, thus causing each probe to have the efficacy of mutual separation when in use.

Description

technical field [0001] The invention relates to a short-circuit preventing structure, in particular to a short-circuit preventing structure for parallel probes. Background technique [0002] Existing detection probes are often used for component performance testing of wafer chips during the packaging and testing stage. In order to achieve the purpose of shortening the test time, packaging and testing manufacturers often use parallel test probes to reduce the testing time. The so-called parallel probes are formed by arranging a plurality of detection probes in parallel; and since the distances between the measurement contacts of the chip are quite close, the distances between the detection probes must also be quite close. Generally speaking, when the parallel probes are used for chip performance testing, the parallel probes are vertically or slightly inclined to contact the corresponding measurement contacts of the probes for measurement. [0003] However, since the distance...

AI Technical Summary

Problems solved by technology

[0008] The purpose of the present invention is to provide a solution to the problem that the existing parallel probes with isolation design cannot touch the measurement contacts because the probes are restricted by a fixed isolation block, and the probe with isolation arms has a complex structure. problem, and the problem that the parallel-type high-density probe array cannot avoid the lateral short circuit of the parall

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