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System and method for re-configuring memory according to chip pin position and loopback signal characteristics

A technology of loopback signal and reconfiguration, applied in the field of memory system and memory conversion, can solve the problems of occupying test machine space and increasing test cost

Active Publication Date: 2009-07-01
KING YUAN ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It not only increases the test cost, but also takes up the space of the test machine

Method used

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  • System and method for re-configuring memory according to chip pin position and loopback signal characteristics
  • System and method for re-configuring memory according to chip pin position and loopback signal characteristics
  • System and method for re-configuring memory according to chip pin position and loopback signal characteristics

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Embodiment Construction

[0027] see figure 1 see also figure 2 , figure 1 It is a system structure diagram before the reconfiguration of the data storage device of the present invention, figure 2 It is a schematic diagram of the I / O pins of the chip under test corresponding to the configurable memory blocks in the present invention. Such as figure 1 As shown, the present invention is a system and method for reconfiguring memory according to the characteristics of the output pins of the chip under test, which mainly includes a chip under test 44 , a configurable memory 1 , and a controller 2 .

[0028] The chip under test 44 includes an input pin 41 , an output pin 42 , and at least one output / input pin 43 , wherein the output value of the chip under test 44 is to output a test result through the output pin 42 .

[0029] Such as figure 1 , figure 2 As shown, the configurable memory 1 includes a first storage area 11 , a second storage area 12 , and a third storage area 13 . Wherein, the first...

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Abstract

The invention relates to a system for reconfiguring memory according to chip pin position and return signal characteristics and a method thereof. The system comprises an object chip, a configurable memory and a controller, wherein the controller determines if the preset return signal values stored in the configurable memory are same, to set a comparison reference value to replace the preset return signal value stored in the configurable memory; the controller appoints a storage region corresponding to the output pin of the object chip and reconfigures the storage region into a data acquisition expansion region for expanding the capacity of a data acquisition memory. Therefore, under the prior system structure, the invention can expands the capacity of data acquisition memory, without adding memories, thereby saving cost and system space.

Description

technical field [0001] The present invention relates to a memory system and a memory conversion method, especially to a system and method for reconfiguring the memory according to chip pins and return signal characteristics, so as to expand the memory capacity of the controller for capturing data. Background technique [0002] see figure 1 , is the system structure diagram of the present invention before the reconfiguration of the data storage memory, which is also the system structure diagram of the traditional chip testing equipment. Wherein, the configurable memory 1 includes a first storage area 11 , a second storage area 12 , and a third storage area 13 . And the feature values ​​are stored in the first storage area 11 and the third storage area 13 respectively. Then use the second storage area 12 to store the preset loopback signal value. [0003] Firstly, the digital circuit 20 reads the characteristic values ​​of the first storage area 11 and the third storage are...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R31/28G11C15/00
Inventor 梁文山蔡佳宏
Owner KING YUAN ELECTRONICS