Test method and device for command line interface

A command-line interface and testing method technology, applied in software testing/debugging, digital transmission systems, electrical components, etc., can solve problems such as low testing efficiency, multiple system resources, and inability to meet testing requirements for system upgrades or changes. Achieve the effects of improving efficiency, reducing waste, and improving testability

Inactive Publication Date: 2009-07-01
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0007] To sum up, in the process of realizing the present invention, the inventor found that there are at least the following problems in the prior art: According to the command format and command tree in the prior art Structure, when the device is performing command testing, it needs to consume more system resources to realize the test calculation process. At the same time, when the number of commands is large, the test efficiency is also very low, which cannot meet the testing requirements of system upgrades or changes.

Method used

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  • Test method and device for command line interface
  • Test method and device for command line interface
  • Test method and device for command line interface

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Embodiment Construction

[0026] The embodiment of the present invention provides a testing method and device of a command line interface. For high-end data equipment, when testing the command line interface, it often faces many problems, such as multi-view problems, multi-level problems, multi-command branch problems and unused commands. The embodiment of the present invention simplifies the construction of the command tree by converting the common aggregation command into an equivalent binary tree, establishes an easy-to-test command tree, improves the testability, thereby reduces the waste of computing resources of the device, and Greatly improved the efficiency of the test.

[0027] The process of the above method can also be written in a test script language of TCL (Tool Command Language), and each process step is generated into a functional module of an automated test, and then combined with a command line test tool for use. In this way, automated testing can be realized during the testing p...

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Abstract

The invention provides a method and a device for testing a command line interface (CLI). The method comprises the following steps: acquiring a cluster command to be tested; conducting equivalent binary tree conversion to the cluster command from the root node of the cluster command; traversing the leaf node of the equivalent binary tree; accessing the path from the leaf node to the root node to acquire each single command and the corresponding expected prompting message; and testing the acquired single commands. The method simplifies the construction of the command tree through equivalent binary tree conversion and establishes a command tree which can be easily tested, thereby improving the testability, reducing the waste of computing resources of equipment and remarkably improving the testing efficiency.

Description

technical field [0001] The invention relates to the field of equipment testing, in particular to a testing method and device for a network equipment command line interface. Background technique [0002] A command line interface (Command Line Interface, CLI) is a main operation mode for setting current network devices. With the increasingly perfect functions of network devices, the content of the command line is also constantly enriched. When using the command line interface to operate network devices, it is often encountered multi-view, multi-user-level command line interface, and different views or different The command tests that can be performed by the user-level command line interface are not the same, and there can be thousands of commands at every turn, and the combination of different meanings between commands can even reach as many as hundreds of thousands. Or change, there will be a replacement of old and new commands in the system equipment, which puts forward hig...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04L12/26G06F11/36
Inventor 石戬
Owner HUAWEI TECH CO LTD
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