Method and device for repairing single event upset in field programmable logic gate array

A single-event flipping and programming logic technology, applied in the repair method and device field of single-event flipping, can solve the problems of expensive FPGA devices, increase, and affect the normal operation of FPGA devices, and achieve simple structure, cost reduction, and improved stability and reliability effects

Inactive Publication Date: 2009-10-07
NAT UNIV OF DEFENSE TECH
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AI Technical Summary

Problems solved by technology

[0006] At present, in the on-board signal processing platform, on the one hand, high-performance, large-scale, and high-grade FPGA devices are extremely expensive; Due to the large number of on-chip SRAM (Static Random Acces

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  • Method and device for repairing single event upset in field programmable logic gate array
  • Method and device for repairing single event upset in field programmable logic gate array
  • Method and device for repairing single event upset in field programmable logic gate array

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Embodiment Construction

[0040] The present invention will be further described in detail below in conjunction with specific embodiments and accompanying drawings.

[0041] Such as figure 1As shown, taking the SRAM-type FPGA as an example, a typical SRAM-type FPGA is internally an array composed of configurable logic blocks (CLB, Configurable Logic Block) and switch matrix (Switch Matrix). Wherein, the CLB based on a look-up table (LUT, Look Up Table) can realize any combination of multiple input / multiple output or sequential logic circuit. The programmable interconnection point determines the connection relationship of the internal connection lines of the switch matrix, and multiple CLBs are connected together through an input / output multiplexer (IO Mux) to form a circuit required by the user. In the SRAM FPGA, the programmable bits used to configure the circuit components form a configuration bit stream, which is stored in an SRAM memory in units of configuration frames. The SRAM memory that store...

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Abstract

A method and a device for repairing single event upset in a field programmable logic gate array are disclosed, a high-reliability monitoring unit, which is connected with the field programmable logic gate array and used for realizing the detection and the repair of the single event upset, is set; a read-back process of a configuration memory of the field programmable logic gate array is implemented by the high-reliability monitoring unit in order to read configuration frames of the field programmable logic gate array, and original configuration frames, which are read from a non-volatile memory via a standard NVRAM interface, are then implemented by the high-reliability monitoring unit; the high-reliability monitoring unit compares the read-back configuration frames with the original configuration frames by bytes, when comparison error occurs on the configuration frames, it is judged that the single event upset in the configuration memory of the field programmable logic gate array occurs, and the high-reliability monitoring unit executes a repair process to repair the incorrect configuration frames of the field programmable logic gate array. The invention has the advantages of simple structural principal, convenient operation, high reliability and good stability.

Description

technical field [0001] The invention mainly relates to the field of space instrument engineering, in particular to a method and device for repairing single event flipping in field programmable logic gate arrays. Background technique [0002] Cosmic space is full of various particles from the vast universe: protons, electrons, alpha particles, heavy ions, gamma rays, etc. The radiation effects caused by these particles, especially the single event effect, affect the reliability of space electronic instruments. [0003] In recent years, with the development and application of VLSI (Very Large Scale Integrated circuits) technology, Field Programmable Logic Gate Array (FPGA, Field Programmable Gate Array) has gradually replaced traditional logic circuits by virtue of its superior interface performance and has become An important part of the on-board processing platform has begun to be applied in aerospace engineering. [0004] With the improvement of the manufacturing process, ...

Claims

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Application Information

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IPC IPC(8): G06F11/00G11C16/06
Inventor 邢克飞陈建云张传胜杨建伟钟小鹏胡助理周永彬明德祥王跃科杨俊
Owner NAT UNIV OF DEFENSE TECH
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