Multi-functional integrated circuit chip testing machine

Abstract

The present invention relates to a multi-functional integrated circuit chip testing machine which comprises the following components: a casing, an inner testing machine mainboard, an AC signal card group and a DC signal card group. The AC signal card group and the DC signal card group are connected with each other and are respectively installed on the testing machine mainboard. The testing machine mainboard is respectively connected with a PC controlled and a tested chip carrier plate. The multi-functional integrated circuit chip testing machine is technically characterized in that the testing machine mainboard is also installed with a digital/analog chip testing card and an analog/digital chip testing card. The multi-functional integrated circuit chip testing machine of the invention is reasonably designed, realizes the test function to different types of integrated circuit chip, reduced device investment of the integrated circuit manufacturer and saves the operation and maintenance cost of the device. Furthermore the multi-functional integrated circuit chip testing machine of the invention has the characteristics of wide testing range, stable performance, high testing speed, high efficiency, flexible and convenient using, etc.

Description

technical field [0001] The invention belongs to the field of integrated circuit chip testing, in particular to a multifunctional integrated circuit chip testing machine. Background technique [0002] After designing and producing integrated circuit chips, integrated circuit design and manufacturers usually need to use a dedicated chip testing machine to test integrated circuit chips to identify bad chips and mark them. Only integrated circuit chips that pass the test can be sold in the factory. Integrated circuit chips that have not passed the test cannot leave the factory, creating conditions for the production of subsequent processes. At present, domestic integrated circuit chip testing mainly includes two modes: self-testing by integrated circuit chip manufacturers and testing by entrusting professional testing manufacturers. Due to the lack of testing capabilities of domestic chip manufacturers and the scarcity of professional testing manufacturers, chip testing has bec...

AI Technical Summary

Problems solved by technology

Existing chip testing machines can usually only test one type of integrated circuit chip, but cannot test multiple types of integrated circuit chips. Therefore, integrated circuit chip manufacturers need to purchase multiple

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