Real-time observation single-beam dual-mode parameter adjustable Z scanning device and measurement method

A scanning device and parameter technology, applied in the field of nonlinear optics, can solve the problem that the nonlinear refractive index and nonlinear absorption coefficient of materials cannot be measured at the same time, it is difficult to control the angle difference between the pump light and the probe light, and it is difficult to obtain nonlinear effects. Internal mechanism and other problems, to achieve the effect of real-time observation of data processing, convenient parameter setting, and convenient measurement

Inactive Publication Date: 2009-12-23
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

[0003] This method has a simple optical path, convenient processing, and high precision; however, this method generally cannot measure the nonlinear refractive index and nonlinear absorption coefficient of the material at the same time, and it cannot be determined whether the nonlinearity of the material comes from the intrinsic effect caused by the laser or caused by the laser. Due to the structural changes of the material itself, it i...

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  • Real-time observation single-beam dual-mode parameter adjustable Z scanning device and measurement method
  • Real-time observation single-beam dual-mode parameter adjustable Z scanning device and measurement method
  • Real-time observation single-beam dual-mode parameter adjustable Z scanning device and measurement method

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Embodiment Construction

[0035] The present invention will be further described below in conjunction with the embodiments and accompanying drawings, but the protection scope of the present invention should not be limited thereby.

[0036] see first figure 1 , figure 1 It is an optical path diagram of a single-beam dual-mode parameter-adjustable Z-scan device for real-time observation of the present invention. It can be seen from the figure that the single-beam dual-mode parameter-adjustable Z-scan device for real-time observation of the present invention is divided into three parts, a parameter modulation part, a data acquisition part and an observation system. The parameter modulation part and data acquisition system are in the main optical path, and their distribution on the main optical axis is (from left to right): laser 1, first adjustable attenuator 2, acousto-optic modulator 3, first aperture stop 5. The first dichroic prism 8, the second dichroic prism 9, the focusing lens 11, the sample 12,...

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Abstract

The invention relates to a real-time observation single-beam dual-mode parameter adjustable Z scanning device and measurement method. The device mainly comprises a parameter modulation part, a data acquisition part and an observation part, wherein in the parameter modulation part, after passing through an adjustable attenuator and an acoustooptical adjustor, laser is transformed into a laser beam with adjustable power pulse and is focalized onto the surface of a sample by lens; in the data acquisition part, emergent light on the back surface of the sample is divided into two beams by a dispersion prism, one beam of light directly enters a detector thus the nonlinear absorption of material is acquired, and the other beam of light enters the other detector by a small aperture of which the center is coaxial with an optical axis thus the nonlinear refraction of the material is acquired; and in the observation part, a cold light source illumination device is additionally arranged on the light path of the device so that the change of points of action can be observed in real time in experiments. The invention is easy to realize, and can acquire the nonlinear absorption rate and the nonlinear refraction rate of materials in different conditions.

Description

technical field [0001] The invention relates to nonlinear optics, which is a single-beam dual-mode parameter-adjustable Z-scanning device and a measuring method for real-time observation of measuring material nonlinear refractive index and nonlinear absorption. The device has multiple modes, convenient parameter setting, and data The processing is simple and real-time observation is possible. Background technique [0002] The development of information optics and the progress of sample preparation technology make the combination of nanotechnology and optics better, and many of the effects are more nonlinear properties of materials. Nonlinear effects play an important role in optical switching, self-phase modulation and self-focusing (defocusing). It is an important property of materials, so it is necessary to understand the nonlinearity of materials. Generally speaking, there are third harmonic generation, optical Kerr switching, anharmonic four-wave mixing and Z-scan techn...

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Application Information

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IPC IPC(8): G01N21/17G01N21/41G01N21/01
Inventor 刘静魏劲松
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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