Real-time observation single-beam dual-mode parameter adjustable Z scanning device and measurement method

Abstract

The invention relates to a real-time observation single-beam dual-mode parameter adjustable Z scanning device and measurement method. The device mainly comprises a parameter modulation part, a data acquisition part and an observation part, wherein in the parameter modulation part, after passing through an adjustable attenuator and an acoustooptical adjustor, laser is transformed into a laser beam with adjustable power pulse and is focalized onto the surface of a sample by lens; in the data acquisition part, emergent light on the back surface of the sample is divided into two beams by a dispersion prism, one beam of light directly enters a detector thus the nonlinear absorption of material is acquired, and the other beam of light enters the other detector by a small aperture of which the center is coaxial with an optical axis thus the nonlinear refraction of the material is acquired; and in the observation part, a cold light source illumination device is additionally arranged on the light path of the device so that the change of points of action can be observed in real time in experiments. The invention is easy to realize, and can acquire the nonlinear absorption rate and the nonlinear refraction rate of materials in different conditions.

Description

technical field [0001] The invention relates to nonlinear optics, which is a single-beam dual-mode parameter-adjustable Z-scanning device and a measuring method for real-time observation of measuring material nonlinear refractive index and nonlinear absorption. The device has multiple modes, convenient parameter setting, and data The processing is simple and real-time observation is possible. Background technique [0002] The development of information optics and the progress of sample preparation technology make the combination of nanotechnology and optics better, and many of the effects are more nonlinear properties of materials. Nonlinear effects play an important role in optical switching, self-phase modulation and self-focusing (defocusing). It is an important property of materials, so it is necessary to understand the nonlinearity of materials. Generally speaking, there are third harmonic generation, optical Kerr switching, anharmonic four-wave mixing and Z-scan techn...

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Problems solved by technology

[0003] This method has a simple optical path, convenient processing, and high precision; however, this method generally cannot measure the nonlinear refractive index and nonlinear absorption coefficient of the material at the same time, and it cannot be determined whether the nonlinearity of the material comes from the intrinsic effect caused by the laser or caused by the laser. Due to the structural changes of the material itself, it is difficult to derive the internal mechanism leading to the nonlinear effect

Soochow University Yang Junyi et al. (ZL 200820041810.1) used pump light and probe light to perform Z-scan measurement. The difficulty is that it is difficult to control the angle difference between pump light and probe light, and it is difficult to achieve better results. It is difficult to adjust, and it is not as simple and effective as the single-beam optical path

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