Near infrared spectrum detection method for insulation coating layer thickness of silicon steel
A near-infrared spectroscopy and near-infrared spectrometer technology is applied in the field of thickness detection of cold-rolled silicon steel insulation coating, which can solve problems such as application blanks and achieve the effect of expanding the application field.
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[0019] The present invention will be described in further detail below in conjunction with the accompanying drawings and the embodiments completed by the inventors according to the above-mentioned technical solutions. The following examples are only preferred examples, and the present invention is not limited to these examples.
[0020] The silicon steel insulating coating to be tested in this example is an environmentally friendly semi-organic coating with a thickness in the range of 1.02 μm-1.98 μm. The standard value of each insulating coating thickness of the silicon steel sample is obtained by a coating thickness gauge based on the electromagnetic method, and the near-infrared spectrum of the sample insulating coating is obtained by scanning with an AOTF near-infrared spectrometer. The near-infrared spectrum of the layer realizes the detection of the thickness of the silicon steel coating.
[0021] 1. Near-infrared characteristic absorption spectrum of insulating coating...
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