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Femtosecond laser plasma channel interferogram phase and electron density extraction method

A plasma and electron density technology, applied in the field of optical measurement, can solve the problems of increasing calculation error data processing speed and so on

Inactive Publication Date: 2010-07-14
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

This phase stitching process will increase unnecessary calculation errors and limit the data processing speed, and the simplicity and efficiency of its calculations need to be further improved

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  • Femtosecond laser plasma channel interferogram phase and electron density extraction method
  • Femtosecond laser plasma channel interferogram phase and electron density extraction method
  • Femtosecond laser plasma channel interferogram phase and electron density extraction method

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Embodiment Construction

[0059] The present invention will be further described below in conjunction with the accompanying drawings and embodiments, but the protection scope of the present invention should not be limited thereby.

[0060] The femtosecond laser plasma channel interferogram phase and electron density extraction method of the present invention, the method comprises the following steps:

[0061] ①Background interference light intensity map I of probe light without plasma taken by CCD camera bg (i, j) and the plasma channel interference light intensity diagram I(i, j) of the probe light when there is plasma;

[0062] ② Interferogram filtering and denoising:

[0063] The two-dimensional interference light intensity matrix I(i, j) (M=200, N=800, that is, the size of the matrix is ​​200×800) of the probe light captured by the CCD camera when there is plasma, after two-dimensional fast Fourier transform Transform to get its spectrum matrix I ω (i,j). Sets the cutoff frequency ω of the seco...

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Abstract

The invention discloses a femtosecond laser plasma channel interferogram phase and electron density extraction method, which comprises the following steps of: shooting a background interference light intensity diagram of probe light when no plasma exists and a plasma channel interference light intensity diagram when the plasma exists by a CCD (Charge Coupled Device) camera; filtering and denoising the diagrams; searching light and dark stripe positions; obtaining the plasma channel phase difference space distribution P(i, j) and the background phase difference space distribution Pbg(i, j) by calculating; obtaining a phase difference space distribution diagram P0(i, j) after deducting the background; denoising the phase difference space distribution diagram P0(i, j) after deducting the background; obtaining symmetrical phase distribution diagrams Ps(i, j) by symmetrizing the phase difference distribution of a smooth phase difference space distribution diagram; and obtaining a plasma channel electron density distribution diagram by treating the symmetrical phase distribution diagrams Ps(i, j) through an abel transformation method.

Description

technical field [0001] The invention belongs to the field of optical measurement, in particular to a femtosecond laser plasma channel interferogram phase and electron density extraction method. Background technique [0002] The interaction between femtosecond intense laser and matter is one of the hot frontiers of current scientific research. In recent years, with the rapid development of ultra-short and ultra-intense laser technology, ultra-short pulse laser with a time width of only a few femtoseconds has been realized on a miniaturized desktop laser system, and the focusable power density has reached 10 21 W / cm 2 Even higher order. Such high laser intensities have been used in experiments that interact with solid and gas targets, including laser particle acceleration, generation of high-energy X-rays and nuclear fusion neutrons, among others. In the study of the interaction between these ultrafast intense lasers and matter, the electron density distribution of the plas...

Claims

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Application Information

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IPC IPC(8): G01J9/02
Inventor 周子理卢海洋夏长权刘建胜李儒新
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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