Method for marking sequence number of scanning lines and mask plate
A scanning line and mask technology, applied in the field of liquid crystal displays, can solve the problem of inability to accurately locate pixels and other problems
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Embodiment 1
[0036] The scanning line serial number labeling method provided by the embodiment of the present invention can be used not only for the labeling of the gate scanning line serial number, but also for the labeling of the data scanning line serial number. The method for marking the serial number of the data scanning line while making the gate scanning line will be described in detail below in conjunction with the accompanying drawings, and the photoresist used in this embodiment is a positive photoresist.
[0037] First, if Figure 4 As shown, a gate metal layer 11 is deposited on a large-sized glass substrate 10 , and then a photoresist 12 is coated on the gate metal layer 11 .
[0038] Due to the large size of the glass substrate 10, the above-mentioned photoresist 12 needs to be exposed in different regions, and the mask used in it is as follows: Figure 5 As shown, the mask plate includes a partial exposure area 4, a partial exposure area 5 and a partial exposure area 6, and...
Embodiment 2
[0069]The scanning line serial number labeling method provided by the embodiment of the present invention can be used not only for the labeling of the gate scanning line serial number, but also for the labeling of the data scanning line serial number. The method for marking the serial number of the data scanning line during the process of manufacturing the data scanning line will be described in detail below in conjunction with the accompanying drawings, and the photoresist used in this embodiment is a positive photoresist.
[0070] Its specific labeling process is similar to that of Example 1, except that after the source / drain metal layer is fabricated, photoresist is coated on the source / drain metal layer, and then exposed through a mask, which corresponds to the data A light blocking block is provided at a position beside the scanning line, so as to form a photoresist reserved area on the photoresist.
[0071] Then use the method in Embodiment 1 to code the photoresist res...
Embodiment 3
[0079] An embodiment of the present invention provides a mask, including a light-transmitting substrate, on which a pattern area forming a scan line is provided, and the pattern area includes a photoresist reserved for forming a line number next to the corresponding position of the scan line. The pattern of the pattern, and the pattern of the photoresist reserved area next to the corresponding position of the scanning line.
[0080] If a positive photoresist is used to carry out the mask patterning process, the above-mentioned pattern forming the photoresist reserved area is a light-shielding block, and the above-mentioned pattern forming the photoresist reserved pattern of the line number is a light-shielding pattern, as detailed below Detailed description of mask patterning process using positive photoresist
[0081] That is to say, a light-shielding block and a line numbering pattern with light-shielding properties are designed in the corresponding area next to the scanning...
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