Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Optical power meter for testing passive optical network

A passive optical network and optical power meter technology, applied in the field of circuit modules, can solve the problems of difficulty in network installation and maintenance, and the optical power meter cannot obtain test results, etc., and achieves the effect of solving power measurement and convenient installation.

Active Publication Date: 2010-09-22
上海光家仪器设备有限公司 +1
View PDF0 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The standard optical power meter in the prior art can only correctly test the continuous optical signal, so if the traditional optical power meter (recording the average optical power in a sampling period) is used, the correct test result cannot be obtained, thus giving a negative impact on the installation of the network Maintenance brings difficulties, so a new type of optical power meter that can meet the power test requirements of PON systems is required

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Optical power meter for testing passive optical network
  • Optical power meter for testing passive optical network
  • Optical power meter for testing passive optical network

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0015] Depend on figure 2 , image 3 , Figure 4 It can be seen that the present invention includes: a two-way coupler; the two-way coupler directly connects to the 1310nm burst module after splitting the uplink signal, and uses a high-isolation WDM to separate the wavelengths before separately connecting the downlink signal 1490nm module and 1550nm module; the 1490nm module and the 1550nm module are connected to the MCU through the A / D conversion module; the 1310nm burst module includes: a current that is converted into a proportional relationship through a high-speed photodetector PIN tube; Then the pre-amplification circuit composed of the pre-high-speed broadband amplifier is converted into a voltage signal, and the voltage signal is respectively connected to the voltage sampling and comparison circuit through signal shaping; the comparis...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an optical power meter for testing a passive optical network, comprising a bidirectional coupler, wherein the bidirectional coupler splits an uplink signal and then is directly connected to a 1310 nm burst module; in addition, the bidirectional coupler splits the wavelength by using a WDM (Wavelength Division Multiplex) with high isolation after splitting a downlink signal and then is respectively connected to a 1490 nm module and a 1550 nm module which are connected with an MCU (Microprogrammed Control Unit) through an A / D conversion module; the 1310 nm burst module is converted into proportional current by using a high-speed optical detector PIN (Personal identification Number) tube and is converted into a voltage signal by using a preposed amplifying circuit formed by a preposed high-speed wideband amplifier; the voltage signal is subjected to signal shaping and is respectively connected with a voltage sampling circuit and a comparison circuit; the comparison circuit is connected with the MCU through a time delay circuit and a trigger circuit; one path of the voltage sampling circuit is connected with the MCU through the A / D conversion module; and the other path of the voltage sampling circuit is connected with the MCU through the trigger circuit. The invention has the benefits of measuring a burst 1310 nm signal, thereby solving the problem of power measurement in the installation process of the PON (Passive Optical Network).

Description

technical field [0001] The invention relates to an optical power meter for testing a passive optical network, in particular to a circuit module of the optical power meter. Background technique [0002] At present, FTTx (collectively referred to as fiber-to-the-home, fiber-to-the-building, and fiber-to-the-premises, etc.) network construction is becoming a hot spot in the construction of access networks at home and abroad. Passive Optical Network (PON) access network technology is recognized as the best solution for FTTx in the industry. This technology allows multiple users to share a single optical fiber, so that no active optical distribution network (ODN) needs to be used. Devices, that is, do not need to pass through optical / electrical / optical (O / E / O) conversion, this point-to-multipoint architecture greatly reduces network installation, management and maintenance costs. The new generation of network construction will inevitably bring new testing problems, which require...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01J1/16
Inventor 陈春姜洋章新园李亮亮
Owner 上海光家仪器设备有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products