Experimental method for single event effects (SEE) of pulse width modulator (PWM)
A technology of single event effect and pulse width modulator, which is applied in the direction of instruments, electronic circuit testing, measuring devices, etc., and can solve problems such as PWM electrical performance changes, faults, and abnormalities in spacecraft electronic systems
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Embodiment 1
[0021] Californium source simulates PWM UC1845 single event effect test, and its experimental system is as follows: figure 2 shown.
[0022] 1) Uncover the UC1845 device in the ceramic package, place the normal UC1845 device in the vacuum chamber after opening the cover, and correctly connect the test system and power supply system;
[0023] 2) On the basis that the sample works normally, the fission fragments of californium source are used for irradiation;
[0024] 3) During the irradiation process, the monitoring system monitors in real time whether the SEE phenomenon occurs in the tested sample, the beam current monitoring system monitors the fluence rate of the incident particles in real time, the test system can observe the obvious single event effect phenomenon, and record the single event event Number, electrical parameters of the sample and irradiation time to calculate the single particle cross section. The test results are shown in Table 1.
[0025] Table 1 Singl...
Embodiment 2
[0028] Pulse laser simulates PWM UC1845 single event effect test, and its experimental system is as follows: image 3 shown.
[0029] 1) Uncover the UC1845 device in the ceramic package, place the normal UC1845 device on the DUT mobile platform of the laser simulation single event effect test system, and correctly connect the test system and power supply system;
[0030] 2) Focus on the DUT platform sample of the laser simulation single event effect test system;
[0031] 3) After focusing, start pulsed laser irradiation on the basis that the sample is working normally;
[0032] 4) During the irradiation process, determine the single event sensitive area of the UC1845 device and the energy threshold of the single event effect of the device. The test results are shown in Table 2.
[0033] Table 2 SEE energy threshold of UC1845 device
[0034]
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