Image processing system and sampling phase correction method of memory device

An image processing and phase correction technology used in static memory, cathode ray tube indicators, instruments, etc. to avoid access errors

Inactive Publication Date: 2013-01-02
HIMAX TECH LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The memory device is used to store multiple image data

Method used

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  • Image processing system and sampling phase correction method of memory device
  • Image processing system and sampling phase correction method of memory device
  • Image processing system and sampling phase correction method of memory device

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Experimental program
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Embodiment

[0026] figure 2 is an image processing system according to an embodiment of the present invention. The image processing system 200 includes a memory device 201 , an image processing device 205 , a processor 203 and a ROM device 204 . The image processing device 205 receives an image control signal S from a host (not shown in the figure) V , process image control signal S V And generate corresponding image data. The memory device 201 is used for storing image data. The image processing device 205 may include a memory device controller 202 for controlling the access operation of the memory device 201, wherein the memory device controller 202 accesses the image data DATA through a plurality of data lines according to the clock signal CLOCK and the address signal ADD. According to an embodiment of the present invention, the memory device 201 may be a synchronous dynamic random access memory (Synchronous Dynamic Random Access Memory, SDRAM), and the read-only memory device 204...

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Abstract

The invention relates to an image processing system and a sampling phase correction method of a memory device. The image processing system comprises a memory device, a memory device controller and a processor, wherein in a sampling phase correction period, the memory device controller provides fixed quantities of sampling phases, transmits specific test data to a data line, respectively samples the specific test data according to the sampling phases and corrects rising edges of time pulse signals according to an optimal sampling phase; and the processor detects the sampled specific test data in the sampling phase correction period to acquire and define a minimum sampling phase and a maximum sampling phase for correctly sampling the specific test data and determines the optimal sampling phase according to the minimum sampling phase and the maximum sampling phase, wherein the minimum sampling phase and the maximum sampling phase define an effective sampling zone and the optimal sampling phase is positioned in the front half part of the effective sampling zone.

Description

technical field [0001] The present invention relates to a method for correcting optimal sampling phase of a memory device, in particular to a method for correcting optimal sampling phase of a synchronous dynamic random access memory device. Background technique [0002] When accessing a memory device, some control signals are generally required to control the correctness of data access. These control signals may include, for example, address signals used to indicate data storage location information, and time references used as sampling data Based on the clock signal, etc. Taking a single data rate (SDR) memory device as an example, data is usually sampled at a rising edge of a clock. For a double data rate (DDR) memory device, data can be sampled at both rising and falling edges of the clock, thereby increasing the data transmission rate. [0003] figure 1 It is a timing diagram showing the data DATA on the data line and the clock signal CLOCK. As shown in the figure, s...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G09G5/36G11C29/48
Inventor 萧胜仁吴佳霖苏佑宽
Owner HIMAX TECH LTD
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