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Method and system for detecting material defects based on photonuclear reaction

A technology for detecting materials and defects, applied in the direction of material analysis using measurement of secondary emissions, and can solve problems such as inability to detect

Inactive Publication Date: 2011-06-29
NUCTECH CO LTD +1
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Problems solved by technology

This method uses high-energy X-rays to undergo a photonuclear reaction with nuclides inside the material to be tested, and generates a positron source inside the material to be tested, thereby solving the problem that the external positron source cannot detect the inside of the material

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  • Method and system for detecting material defects based on photonuclear reaction
  • Method and system for detecting material defects based on photonuclear reaction
  • Method and system for detecting material defects based on photonuclear reaction

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Embodiment Construction

[0016] figure 1 It is a schematic diagram of the system for detecting material defects based on photonuclear reaction of the present invention. As shown in the figure, the high-energy X-rays generated by the 15MeV electron accelerator scan the sample under test. Because X-rays have strong penetrating power in the material, they can penetrate deep into the sample, instead of ordinary positrons, which can only analyze the surface layer. After X-ray penetrates into the material, it can interact with some parts of the sample. A photoneutron reaction occurs in the nucleus, causing the nucleus to lose a neutron. After the neutron is lost, the nucleus becomes a neutron-deficient nucleus, so it has β+ radioactivity and can emit positrons, so that positrons are generated inside the sample.

[0017] In the photopositron analysis technology of the present invention, the radiation source used is X-rays generated by a high-energy electron accelerator. The energy of the accelerator is require...

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Abstract

The invention discloses a method and a system for detecting material defects based on photonuclear reaction. The method comprises the following steps: scanning a detected material by a high-energy X-ray, wherein, the high-energy X-ray and target nuclide in the detected material can perform photonuclear reaction so as to generate positive electrons in the detected material; measuring Gamma-photon energy caused by annihilation of the positive electrons by utilizing a detector so as to obtain Gamma-photon energy spectrum broadening; and analyzing the Gamma-photon energy spectrum broadening so as to judge the defect situation of the detected material. In the method, the high-energy X-ray and the nuclide in the detected material perform photonuclear reaction so as to generate a positive electron source in the detected material, so that the problem that an external positive electron source can not detect the interior of the material can be solved.

Description

Technical field [0001] The present invention generally relates to a technology for detecting material defects using X-rays generated by an accelerator, and more specifically, to a method and system for detecting material defects based on photonuclear reactions. Background technique [0002] In the field of non-destructive testing, X-ray transmission imaging, CT, diffraction, neutron photography, ultrasonic inspection, electron microscope and other methods are used to inspect materials for defects. The smallest defect size that can be found is 1μm. For smaller-scale defects, these types of technologies will be powerless. In some special applications, such as aircraft engine blades, it is necessary to detect defects at a smaller level. And hope to be able to make early judgments on the working life of materials through testing. The aforementioned technologies are often found only after the defects have clearly occurred, so they cannot meet actual requirements. [0003] The use of ...

Claims

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Application Information

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IPC IPC(8): G01N23/22
Inventor 李元景康克军杨祎罡李铁柱张勤俭杨鹏
Owner NUCTECH CO LTD
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