Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Readout amplifying circuit for resistive random access memory (RRAM) cell

A technology of resistive storage and readout amplification, applied in information storage, static memory, digital memory information and other directions, can solve the problems of circuit accuracy, large DC power consumption and large DC power consumption of readout amplifier circuit, etc. The effect of reducing interference current, reducing DC power consumption, and improving accuracy

Inactive Publication Date: 2011-07-13
NAT UNIV OF DEFENSE TECH
View PDF3 Cites 26 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As the capacity of the resistive memory cell array increases, the number of sneak paths increases, and the interference current will gradually become more serious, resulting in the sense amplifier circuit not being able to correctly identify the resistance state of the resistive memory cell.
[0007] 2. The DC power consumption of the sense amplifier circuit is large
Since the load resistance is used as the element for detecting the resistance state of the resistive memory cell in each readout bit of the comparison readout stage, there is a direct current path from the word line of the resistive memory cell array to the ground, when the resistive memory cell array When the number of bit lines increases, the DC power consumption of the read operation increases accordingly
At the same time, due to the use of resistors in the reference voltage generation circuit as a voltage divider, the input voltage V input There is a DC path to the ground, resulting in a large DC power consumption
The above reasons cause the overall DC power consumption of the sense amplifier circuit to be relatively large.
[0008] 3. The accuracy of the reference voltage generation circuit is affected
The output voltage of the reference voltage generating circuit V ref The precision of the voltage divider has a strong dependence on the matching precision of the voltage divider. In the manufacturing process of integrated circuits, it is not easy to achieve accurate matching of resistors. Since resistors are used as voltage divider components in the reference voltage generation circuit, it is reduced. To ensure the accuracy of the reference voltage generation circuit

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Readout amplifying circuit for resistive random access memory (RRAM) cell
  • Readout amplifying circuit for resistive random access memory (RRAM) cell
  • Readout amplifying circuit for resistive random access memory (RRAM) cell

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] The structure and working process of the sense amplifier circuit of the resistive memory cell of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0038] Figure 7 It is a structural diagram of the sense amplifier circuit of the resistive memory unit of the present invention, and the present invention is composed of a comparison readout stage and a reference voltage generating circuit. The comparison readout stage is composed of N readout bits, which are in one-to-one correspondence with the bit lines of the resistive memory cell array, that is, the first readout bit corresponds to the first bit line BL 1 , the second read bit corresponds to the second bit line BL 2 , and so on, the Nth read bit corresponds to the Nth bit line BL N . Each read bit consists of a sense amplifier, a feedback resistor, and a voltage comparator. In the i-th read bit, the positive input terminal of the sensitive amplifier is grounded,...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a readout amplifying circuit for a resistive random access memory (RRAM) cell, and provides a novel readout amplifying circuit for an RRAM cell, which reduces the influence of interference current on reading operation, lowers the overall direct current (DC) power consumption and improves the accuracy of a reference voltage generating circuit. The readout amplifying circuitconsists of a comparative readout level and the reference voltage generating circuit, wherein, the comparative readout level consists of N sense bits, the N sense bits and bit lines of an RRAM cell array are in a relationship of one-to-one correspondence, and each sense bit consists of a sensitive amplifier, a feedback resistor and a voltage comparator; and the reference voltage generating circuit consists of M voltage division elements and an operational amplifier, the voltage division elements in the reference voltage generating circuit are capacitors which are connected in series, and a positive input terminal of the operational amplifier is connected with a voltage division point. By utilizing the readout amplifying circuit, the misread rate can be lowered, the overall DC power consumption can be reduced, and the reference voltage output precision of the reference voltage generating circuit can be improved.

Description

technical field [0001] The invention relates to a readout amplifier circuit on the periphery of a resistive variable memory unit array in the field of integrated circuit design, in particular to a readout amplifier circuit which uses a DC gain change to sample resistance value changes and uses a controllable capacitor voltage divider to generate a reference voltage. Background technique [0002] Non-volatile memory is a kind of memory that can retain the original stored information after power failure, and is widely used in modern electronic systems. There are various types of non-volatile memories, and a resistive random access memory (RRAM) is one of them. Due to the characteristics of ultra-high storage density, simple structure, high speed and non-volatility of RRAM, the application prospect is very broad. [0003] The resistive memory cell array is the core of the resistive memory, and is composed of a large number of resistive memory cells according to a certain spati...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G11C7/06
Inventor 方粮刘刚励楠隋兵才张超池雅庆马卓段志奎孙鹤
Owner NAT UNIV OF DEFENSE TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products