Saber-based circuit failure simulation analyzing method
A fault simulation and simulation analysis technology, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve the problems that analog circuits cannot be simulated, faults cannot be simulated, etc., and achieve the effect of improving efficiency
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[0143] The steps of the case implementation process are the above seven steps. For this case, for the failure mode selected in step 2, three failure modes, such as base-collector short circuit, base open circuit, and gain degradation, were selected for bipolar transistors; for transformers, pp pin open circuit, pp, pm were selected There are three failure modes of pin short circuit and parameter drift. After step five, the simulation results of each failure mode are obtained, as shown in Table 3. Step 6 There are two methods of fault criterion setting: waveform discrimination method and parameter discrimination method. In the waveform discrimination method, the waveform similarity is set to 90%; in the parameter discrimination method, the judgment start time is set to 0ms, the judgment end time is 50ms, and three parameters are selected: the maximum value of the signal is set to 12v, the minimum value of the signal is set to Set as -12.5v, signal mean value is set as 0. Thr...
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