IV (current-voltage) characteristic simulation test method of solar cell or module
A technology of solar cell components and solar cells, which is applied in the direction of single semiconductor device testing, electrical components, photovoltaic system monitoring, etc., can solve problems such as the complexity of solar cell characteristic simulation, achieve simple and fast IV characteristic testing, and solve complex problems Effect
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[0028] Such as Figure 1~4 Shown, a kind of IV characteristic simulation test method of solar cell or solar cell module has following steps:
[0029] (1) Optical simulation: (a) Perform light tracing simulation to calculate the rate of photogenerated carriers according to the silicon wafer thickness, pyramid coverage, anti-reflection coating material, and surface scattering coefficient of the solar cell or solar cell module, (b) get the sample The simulated reflectance curve, (c) compare the simulated reflectance curve of the sample with the measured reflectance curve of the sample, and judge whether it is consistent with the measured reflectance curve, (d) if the simulated reflectance curve is consistent with the measured reflectance curve, then the The photogenerated carrier velocity calculated by the light tracing simulation is used as the input parameter of the semiconductor device simulation. If the simulated reflectance curve does not match the measured reflectance curv...
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