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Heavy-ion beam diagnosis device for single particle test and relevant measurement method

A technology of heavy ion beam and diagnostic device, which is applied in the field of device anti-single event effect performance evaluation test, can solve the problems of not mastering quantitative analysis technology, unable to obtain the uniformity of heavy ion fluence distribution in real time, and dose film stay, etc. Accelerator heavy ion beam spot size and uniformity, reduce errors, and achieve the effect of measurement

Inactive Publication Date: 2011-09-28
CHINA INSTITUTE OF ATOMIC ENERGY
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Problems solved by technology

The disadvantage of this method is that the uniformity of heavy ion fluence distribution cannot be obtained in real time, and only offline analysis can obtain it afterwards
In addition, the image analysis of dose films is currently only based on qualitative analysis, and quantitative analysis techniques have not yet been mastered.

Method used

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  • Heavy-ion beam diagnosis device for single particle test and relevant measurement method
  • Heavy-ion beam diagnosis device for single particle test and relevant measurement method
  • Heavy-ion beam diagnosis device for single particle test and relevant measurement method

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Embodiment Construction

[0036] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0037] In order to meet the needs of the development of single-event experiments, in 2009, a special irradiation device for heavy-ion single-event effects was built in the second hall of the tandem accelerator experiment. This set of equipment is designed for the characteristics of heavy ion single particle experiments, and can obtain the heavy ion large beam spot (5cm×5cm) required by the irradiation device, and the non-uniformity of the beam spot fluence distribution is less than ±10%. With the completion of the device, new requirements have been put forward for the heavy ion beam diagnostic technology. In order to obtain information such as ion fluence, fluence rate, beam spot size, and irradiation fluence uniformity required for single particles to adapt to irradiated samples, it is necessary to solve the heavy ion beam diagnostic technology and e...

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Abstract

The invention belongs to a performance evaluation test technology for an anti-single particle effect of a device and in particular relates to a heavy-ion beam diagnosis device for a single particle test and a relevant measurement method. The heavy-ion beam diagnosis device for the single particle test is arranged in a sample radiation target chamber; a monitor group which consists of a plurality of paths of detectors is arranged at a beam inlet of the sample radiation target chamber; the detectors are distributed around an inlet diaphragm; a sample detector group which consists of the plurality of paths of detectors is arranged on a central sample frame of the sample radiation target chamber; the sample frame is connected with a sample movement control system and can drive the sample detector group to move in horizontal and vertical directions; and each path of detectors of the monitor group and each path of detectors of the sample detector group are respectively connected with a computer by an electronic line. By the invention, an error of radiation fluence measurement is reduced, and the measurement of the heavy-ion beam spot size and uniformity of an accelerator can be realized.

Description

technical field [0001] The invention belongs to the anti-single-event effect performance evaluation test technology of devices, and in particular relates to a single-particle test heavy ion beam current diagnosis device and a related measurement method. Background technique [0002] The Beijing HI-13 tandem accelerator is currently a domestic ground simulation test accelerator that is very suitable for evaluating the anti-single event effect performance of satellite devices. In the past ten years, Q3D magnetic spectrometer equipment has been used to carry out a large number of ground simulation tests on the anti-single event effect performance evaluation of satellite devices (hereinafter referred to as single event tests) on the tandem accelerator. [0003] Single-event experiments usually need to accurately obtain the heavy ion fluence of irradiated samples. At the same time, according to the single-event effect, there is also a certain range requirement for the fluence rat...

Claims

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Application Information

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IPC IPC(8): G01T1/02G01T1/29
Inventor 沈东军郭刚陈泉刘建成史淑廷惠宁王慧
Owner CHINA INSTITUTE OF ATOMIC ENERGY
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