Temperature control system and method for performing single event effect test under same

Abstract

The invention relates to a method for performing a single event effect test under the same. The temperature control system comprises a remote control computer, a temperature controller, a heating plate, an infrared probe and a high-temperature conducting wire, wherein the temperature controller is respectively connected with the infrared probe and the heating plate through the high-temperature conducting wire and is connected with the remote control computer, the remote control computer sends a temperature control instruction to the temperature controller, the temperature controller controls the heating of the heating plate according to the temperature control instruction, the infrared probe acquires the heating temperature value of the heating plate and feeds the heating temperature value back to the temperature controller, and the temperature controller modifies and regulates the heating temperature of the heating plate according to the fed-back heating temperature value so as to ensure that the heating temperature is identical to a preset temperature value. The temperature control system can be used for remote automatic calibration, has the advantages of accuracy and stability for measurement, strong anti-jamming capability, high reliability, self-protection capability and strong compatibility, and can meet the requirements of the single event effect test under different temperatures.

Description

technical field [0001] The invention relates to the technical field of single-particle resistance test verification of microelectronic devices, in particular to a temperature control system and a method for performing a single-particle effect test under the temperature control system. Background technique [0002] With the rapid development of semiconductor technology, the integration of microelectronic devices used in spacecraft continues to increase, and more and more large-scale integrated circuits are used in spacecraft. As the feature size and operating voltage of devices are getting smaller and smaller, correspondingly, the critical charge is also Smaller and smaller, the role of the single event effect is also more and more obvious. In recent years, it has been found that the single event effect is more significant, and its damage mode is becoming more and more complicated. [0003] The single event effect occurs when the spacecraft is in orbit, but a large number of...

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Problems solved by technology

[0007] At present, the single particle irradiation test is usually carried out at room temperature, and there is no relevant data based on the single particle irradiation test under temperature control, and there is no temperature control system suitable for the existing radiation test device

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