Chamber shield for vacuum physical vapor deposition
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- FUJIFILM CORP
- Publication Date
- 2014-02-12
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Abstract
Description
technical field
[0001] The present disclosure relates generally to radio frequency (RF) sputtering physical vapor deposition (PVD), and more particularly to forming shields and chamber shields for RF sputtering PVD apparatus. Background technique
[0002] Radio frequency sputtering PVD is a method used to deposit thin films on substrates. The substrate is placed in the vacuum chamber facing the target connected to an RF power source. When RF power is applied, a plasma is formed. Positive gas ions are pulled toward the target surface, impact the target volume, and remove target atoms through momentum transfer. The removed target atoms are then deposited on the substrate to form a thin film layer.
[0003] During physical vapor deposition, it is important to control the properties of the deposited film. Due to the plasma spreading towards the chamber wall or deposition against it, problems arise with regard to the stability of the process or the film. Contents of the inv...