Microwave nondestructive testing device of metal surface defects and testing method thereof

Abstract

The invention provides a microwave nondestructive testing device of metal surface defects and a testing method thereof. The device is characterized in that a T-shaped tube is in signal connection with a microwave frequency scanning meter via a waveguide-coaxial transducer; a first waveguide and a second waveguide of the T-shaped tube are respectively connected with input ends corresponding to a directional coupler; when a main waveguide receives signals, the two arms of the first waveguide and the second waveguide trigger equal-amplitude and cophase microwave signals; the directional coupler is provided with a waveguide probe and a short-circuiting piston at a first port and a second port; the corresponding end of the waveguide probe is connected to a testing end B of a microwave vector network analyzer via the waveguide-coaxial transducer; and the corresponding end of the short-circuiting piston is connected to a testing end A of the microwave vector network analyzer via the waveguide-coaxial transducer. The method is characterized by pressing the waveguide probe vertically close to the tested metal or nonmetal surface to scan the tested metal or nonmetal surface during testing. The device and the method realize positioning and quantitative direct testing of the metal surface defects and automated testing integrating testing, recording, analyzing, processing and filing.

Description

technical field [0001] The invention relates to a metal defect detection device and a detection method thereof, in particular to a metal surface defect microwave detection device comprising a microwave frequency sweeper, a "T" tube, a directional coupler, a waveguide probe, a short-circuit piston and a microwave vector network analyzer. Non-destructive testing device and testing method thereof. Background technique [0002] Existing non-destructive testing methods for metal surface defects include penetrant method (PT), magnetic particle method (MT), eddy current method (ET), etc., but there are great limitations in some testing conditions. For example, both the infiltration method and the magnetic particle method are direct contact detection, and the detection cannot be carried out when the metal to be tested is covered or wrapped by non-metal. However, the infiltration method is difficult to determine the actual depth of the defect, and there is a problem of environmental...

AI Technical Summary

Problems solved by technology

The frequency of the eddy current detector is low, the penetration is poor, and the detection rate of metal surface defects under the non-metallic coating is low, or even undetectable

In addition, when testing, the metal surface must be tested without external interference, real-time online monitoring is not possible, and the test results cannot be recorded, analyzed, processed and archived.

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