MC/DC test data automatic generation method based on genetic algorithm
A technology of test data and genetic algorithm, applied in the field of automatic generation of test data that satisfies MC/DC coverage, can solve the problems of search degradation, lack of guidance information, and failure to consider the data dependencies of the program under test.
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[0096] The present invention will be described in detail below in conjunction with the accompanying drawings.
[0097] The present invention proposes a method for automatically generating MC / DC test data based on a genetic algorithm, which includes generation of an abstract syntax tree, generation of an abstract analysis tree, generation of expected result sets of MC / DC test cases, code insertion, and fitness function The key content such as the structure of the genetic algorithm and the design of the genetic algorithm, the specific process is as follows: figure 1 As shown, it specifically includes the following steps:
[0098] Step 1: Perform static analysis on the program under test to generate information such as control flow graph, data flow graph, abstract syntax tree, and abstract analysis tree; the program under test refers to the software code to be tested.
[0099] With the help of analysis tools (such as the testing tool Testbed), the lexical analysis, syntax analys...
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