Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

System capable of solving inclination problem of narrow field of view lens in wave aberration detection and method thereof

A small field of view and wave aberration technology, applied in the field of optical detection, can solve the problems of difficult control, poor operability and repeatability, and high experience requirements for accurate detection of small field of view lens wave aberration. Good performance and improved detection efficiency

Inactive Publication Date: 2012-03-28
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
View PDF3 Cites 17 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the small field of view angle of the small field of view lens, its surface shape data is more easily affected by the adjustment accuracy of the lens relative to the detection instrument. Usually, manual judgment is made from the appearance of the surface shape interference fringes, and the results are highly random. The regular situation becomes complicated, and the operator’s experience is very high, which makes it difficult to accurately detect the wave aberration of the lens with a small field of view, and the detection efficiency is low, and the operability and repeatability are poor.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System capable of solving inclination problem of narrow field of view lens in wave aberration detection and method thereof
  • System capable of solving inclination problem of narrow field of view lens in wave aberration detection and method thereof
  • System capable of solving inclination problem of narrow field of view lens in wave aberration detection and method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] see figure 1 , the present invention provides a system that can solve the problem of optical axis deflection in the wave aberration detection of small field of view lenses. The self-collimating optical path composed of glass, the self-collimating optical path composed of the self-collimating theodolite 6 and the plane mirror 5, and the self-collimating optical path composed of the laser interferometer 1 and the plane mirror 5. The verticality of the optical axis of the small field of view lens 3 to be measured and the plane reflector 5 is ensured by the self-collimation of the autocollimation theodolite 6 and the optical axis of the small field of view lens to be tested respectively pointing to the tooling 4 and the plane reflector 5, and then through the laser The self-collimation of the interferometer 1 and the plane mirror 5 ensures the verticality of the optical axis of the laser interferometer output beam and the plane mirror 5, thereby realizing the alignment of t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a system capable of solving an inclination problem of a narrow field of view lens in a wave aberration detection process and a method thereof. The system comprises a laser interferometer, a pentagonal prism, an autocollimation theodolite, a planar mirror and an optical axis directional tool which is in common optical axis with a narrow field of view lens to be detected. The laser interferometer, the pentagonal prism, the optical axis directional tool and the planar mirror are provided on a same optical path in order. The pentagonal prism is provided on an emitting optical path of the autocollimation theodolite. The system capable of solving the inclination problem of the narrow field of view lens in wave aberration detection and the method thereof have the characteristics of high detection precision, a short detection period and good repeatability.

Description

technical field [0001] The invention belongs to the field of optical detection, and in particular relates to a system and method capable of solving the problem of optical axis deflection encountered by a small field of view lens in the wave aberration detection process. Background technique [0002] With the continuous development of aerospace and aviation, small field of view lenses are widely used in the above fields due to their high resolution. The wave aberration of the optical system is one of the important indicators to characterize the imaging quality of the lens. It has nothing to do with the performance parameters such as the focal length and relative aperture of the optical system, but it is closely related to other image quality evaluation indicators such as the brightness of the center point and the optical transfer function. Can accurately reflect the performance of the entire optical system. In the detection of wave aberration of most lenses, many results are...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J9/02
Inventor 张学敏魏儒义李华段嘉友侯晓华张羽闫肃
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products