Element measurement method based on laser-induced plasma emission spectral standardization
A plasma and laser-induced technology, applied in the direction of material excitation analysis, etc., can solve the problems of low precision, low measurement accuracy, and low repeatability
Active Publication Date: 2012-04-11
TSINGHUA UNIV
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[0003] The purpose of the present invention is to provide an element measurement method based on spectral standardization, which can be used on the laser-induced plasma spectroscopy system, in order to solve the shortcomings of the current laser-induced plasma spectroscopy technology, such as low repeatability and low precision when directly measuring material components. Solve the problems of low repetition accuracy and low measurement accuracy of this technology
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[0067] 1) Take 20 brass alloys whose concentration of each element is known, as a group of calibration samples, numbered 1 to 20 respectively, the concentration of element copper in this group of samples is 73%, 60.28%, 59.14%, 56.62%, respectively, 59.55%, 69.08%, 80.9%, 85.06%, 90.02%, 95.9%, 96.86%, 94.46%, 92.7%, 89.97%, 70.44%, 67.59%, 64.32%, 63.42%, 60.81%, 57.98%. For each sample of 20 brass alloys, a laser-induced plasma measurement system is used to detect different positions on the sample surface in a protective gas atmosphere, and each position obtains a spectrum containing the characteristic lines of each element atom and ion, And obtain the atomic characteristic line intensity, ion characteristic line intensity, plasma temperature, electron density and the ratio of the ion number to the atomic number of the element to be measured respectively;
[0068] 2) The average value of the plasma temperature obtained for all measurements of 20 brass alloys is 9000K, and th...
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The invention relates to an element measurement method based on laser-induced plasma emission spectral standardization, which is used for element concentration detection.The method comprises the following steps: firstly converting the strength of characteristic spectral lines to the standard plasma temperature and the density ratio of the number of ions to the number of atoms of elements to be measured; then after the strength of the characteristic spectral lines is converted to the standard plasma temperature and the standard density ratio of the number of the ions to the number of the atoms of the elements to be measured, using the sum of the strength of the characteristic spectral lines of the atoms and the ions of the elements to be measured to compensate the density fluctuation in the total particle number in plasma caused by the change in ablation mass; and finally establishing an equation among the concentration of the elements to be measured, the strength of the characteristic spectral lines after conversion and the strength sum of the characteristic spectral lines. When the measurement is performed on a sample with unknown components, the concentration of the elements to be measured can be obtained according to a calibration model by spectral standardization. As the calibration model considers the ablation mass and the impacts of the temperature and the density ratio of the number of the ions to the number of the atoms of the plasma on measurement signals, the fluctuation of the spectral strength caused by the fluctuation of physical parameters of the plasma is compensated and the measurement precision is greatly improved.
Description
technical field [0001] The invention relates to an element measuring method. Specifically, the basic principle of the method is laser-induced plasma spectroscopy (LIBS), and a spectral normalization method is used for online rapid quantitative analysis of the measured samples. Background technique [0002] In recent years, laser-induced plasma spectroscopy (LIBS for short) has become a new elemental analysis technique due to its advantages of high sensitivity, no need for sample pretreatment, and realization of multi-element measurement. However, due to the low repeatability of this technique, the accuracy of measuring the elemental composition of substances is not high, which limits the application of this technique in element measurement. Contents of the invention [0003] The purpose of the present invention is to provide an element measurement method based on spectral standardization, which can be used on the laser-induced plasma spectroscopy system, in order to solve...
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IPC IPC(8): G01N21/63
Inventor 王哲李政李立志袁廷璧侯宗余
Owner TSINGHUA UNIV
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